Proceedings of the 2014 International Conference on Quantitative InfraRed Thermography 2014
DOI: 10.21611/qirt.2014.052
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Detecting hidden defects from real data

Abstract: A defect σ occurs on the inaccessible side of a metallic thin plate Ω. We detect and evaluate σ from real thermal data collected on the opposite side of Ω.

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