Detection of individual sub-pixel features in edge-illumination x-ray phase contrast imaging by means of the dark-field channel

Matsunaga, Norihito; Yano, Kazuhiro; Endrizzi, Marco; Olivo, Alessandro

doi:10.1088/1361-6463/ab5aa0

Cited by 9 publications

(4 citation statements)

References 46 publications

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“…Currently, there are a variety of DF-PCI techniques, e.g. propagation-based DF-PCI, 31,32 grating-based DF-PCI, [33][34][35][36] edge-illumination DF-PCI, 37,38 and analyzer-based DF-PCI. 25,[39][40][41][42] Grating-based PCI has regular gratings placed between the source and detector, for example, the so-called Talbot-Lau interferometer reported by David et al and Momose et al 9,10 In such techniques, the attenuation, differential phase and DF signal can be extracted by measuring the intensity variations caused by introducing the sample in the path of the beam.…”

Section: Introductionmentioning

confidence: 99%

Dark-field tomography of an attenuating object using intrinsic x-ray speckle tracking

et al. 2022

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Purpose: To investigate how an intrinsic speckle-tracking approach to speckle-based X-ray imaging can be used to extract an object's effective dark-field signal, which is capable of providing object information in three dimensions. Approach:The effective dark-field signal was extracted using a Fokker-Planck type formalism, which models the deformations of illuminating reference-beam speckles due to both coherent and diffusive scatter from the sample. We here assumed that (a) small-angle scattering fans at the exit surface of the sample are rotationally symmetric, and (b) the object has both attenuating and refractive properties. The associated inverse problem, of extracting the effective dark-field signal, was numerically stabilised using a "weighted determinants" approach.Results: Effective dark-field projection images are presented, as well as the dark-field tomographic reconstructions of the wood sample. Dark-field tomography was performed using a filtered-back projection reconstruction algorithm. The dark-field tomographic reconstructions of the wood sample provided complementary, and otherwise inaccessible, information to augment the phase-contrast reconstructions, which were also computed.Conclusions: An intrinsic speckle-tracking approach to speckle-based imaging can tomographically reconstruct an object's dark-field signal at a low sample exposure and with a simple experimental set-up. The obtained dark-field reconstructions have image quality comparable to alternative X-ray dark-field techniques.

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Section: Introductionmentioning

confidence: 99%

Dark-field tomography of an attenuating object using intrinsic x-ray speckle tracking

et al. 2022

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“…The ability of the dark-field channel to detect individual sub-pixel features (alongside ‘averaged’ signals from inhomogeneous sample regions) was also recently demonstrated, and it was shown how this could be used to detect micro-damage in electronic components [ 104 ].…”

Section: Edge-illumination X-ray Phase Contrast Imagingmentioning

confidence: 99%

Edge-illumination x-ray phase-contrast imaging

Olivo¹

2021

J. Phys.: Condens. Matter

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Although early demonstration dates back to the mid-sixties, x-ray phase-contrast imaging (XPCI) became hugely popular in the mid-90s, thanks to the advent of 3rd generation synchrotron facilities. Its ability to reveal object features that had so far been considered invisible to x-rays immediately suggested great potential for applications across the life and the physical sciences, and an increasing number of groups worldwide started experimenting with it. At that time, it looked like a synchrotron facility was strictly necessary to perform XPCI with some degree of efficiency—the only alternative being micro-focal sources, the limited flux of which imposed excessively long exposure times. However, new approaches emerged in the mid-00s that overcame this limitation, and allowed XPCI implementations with conventional, non-micro-focal x-ray sources. One of these approaches showing particular promise for ‘real-world’ applications is edge-illumination XPCI: this article describes the key steps in its evolution in the context of contemporary developments in XPCI research, and presents its current state-of-the-art, especially in terms of transition towards practical applications.

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“…The dark-field signal has been measured qualitatively using most of the PCXI techniques, either via an approach where the dark-field information is extracted from contrast seen across a neighbourhood of pixels (such as PBI 24 , 25 and single-grid imaging 20 , 26 , 27 ), or via an approach where the dark-field is extracted on a pixel-by-pixel basis from multiple exposures (such as ABI 28 , GI 29 , and EI 30 – 32 ). One interesting case is multiple-exposure speckle-tracking, where dark-field is extracted from local neighbourhoods of pixels across multiple exposures.…”

Section: Introductionmentioning

confidence: 99%

On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup

How

Paganin

Morgan

2023

Sci Rep

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The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A quantitative measure of this dark-field signal can be useful in revealing the microstructure size or material for medical diagnosis, security screening and materials science. Recently, we derived a new method to quantify the diffusive dark-field signal in terms of a scattering angle using a single-exposure grid-based approach. In this manuscript, we look at the problem of quantifying the sample microstructure size from this single-exposure dark-field signal. We do this by quantifying the diffusive dark-field signal produced by 5 different sizes of polystyrene microspheres, ranging from 1.0 to 10.8 µm, to investigate how the strength of the extracted dark-field signal changes with the sample microstructure size, $$S$$ S . We also explore the feasibility of performing single-exposure dark-field imaging with a simple equation for the optimal propagation distance, given microstructure with a specific size and thickness, and show consistency between this model and experimental data. Our theoretical model predicts that the dark-field scattering angle is inversely proportional to $$\sqrt{S}$$ S , which is also consistent with our experimental data.

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Detection of individual sub-pixel features in edge-illumination x-ray phase contrast imaging by means of the dark-field channel

Cited by 9 publications

References 46 publications

Dark-field tomography of an attenuating object using intrinsic x-ray speckle tracking

Dark-field tomography of an attenuating object using intrinsic x-ray speckle tracking

Edge-illumination x-ray phase-contrast imaging

On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup

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