1990
DOI: 10.1007/bf02035808
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Determination of hafnium in zirconium oxide using inductively coupled plasma emission spectrometry

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Cited by 4 publications
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“…Various techniques such as neutron activation analysis (NAA), , isotopic dilution spark source mass spectrometry (ID SS MS), spectrophotometry, , emission spectrography, , spectrofluorimetry assisted by chemometric methods, inductively coupled plasma atomic emission spectrometry (ICP-AES), and X-ray fluorescence spectrometry (XRF) have been used for determination of impurities of Hf in zirconium matrix. Generally, many of them suffer due to matrix interferences and some of them are not suitable for determination of microamounts of hafnium in zirconium.…”
mentioning
confidence: 99%
“…Various techniques such as neutron activation analysis (NAA), , isotopic dilution spark source mass spectrometry (ID SS MS), spectrophotometry, , emission spectrography, , spectrofluorimetry assisted by chemometric methods, inductively coupled plasma atomic emission spectrometry (ICP-AES), and X-ray fluorescence spectrometry (XRF) have been used for determination of impurities of Hf in zirconium matrix. Generally, many of them suffer due to matrix interferences and some of them are not suitable for determination of microamounts of hafnium in zirconium.…”
mentioning
confidence: 99%