Determination of overwrite specification in thin-film head/disk systems

Bhattacharyya, Manoj K.; Gill, H. S.; Simmons, R.

doi:10.1109/20.45329

Cited by 12 publications

(3 citation statements)

References 13 publications

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“…For Ho < 3H,, the residual overwrite dominates the yields extremely large overwrite ratio. When Ho 1.6 H,, the overwrite curve shows a "shoulder," which has been noted previously [ 5 ] . This is due to a reduction in total writing field at the gap center during the writing process.…”

Section: Resultssupporting

confidence: 75%

Overwrite in thin film disk recording systems

1993

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Overwrite in thin film rigid disk recording has been studied experimentally using disks with a wide range of magnetic moment and coercivity. Standardh/J overwrite was investigated in detail at various recording currents and different flying heights. A theoretical model was developed using simple analytical approximations that relate demagnetization-field-induced position shift (hard transition shift) to the measured overwrite. The demagnetization fields due to the leading edge transitions were calculated analytically including a good approximation to the gapped head image. The results compare well with experimental measurements. A new overwrite measurement technique using the second harmonic component of a 0.5J signal is also described in this work.

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Section: Resultssupporting

confidence: 75%

Overwrite in thin film disk recording systems

1993

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“…A two-dimensional application has been reported by Bhattacharyya, Gill, and Sim-The peak voltage is found by putting x ϭ 0 in the above exmons (34). A more elaborate and careful three-dimensional pression and the pulsewidth at half maximum (PW 50 ), an imwork has been done by Davidson (35).…”

Section: Magnetoresistive Headsmentioning

confidence: 98%

Magnetic Recording Heads

Brug

Bhattacharyya

Anthony

et al. 1999

Wiley Encyclopedia of Electrical and Electronics Engineering

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“…A widely used method is CVD (Chemical Vapor Deposition) and it is required to get the desired thin film as required. Bhattacharyya, M.K et al presented an accurate method of computing overwrite based on a self-consistent method of magnetization calculation and Preisach type hysteresis modeling [26]. Carbon nitride thin film on HDD was studied and its advantages are highlighted [28].…”

Section: Thin Film and Storage Diskmentioning

confidence: 99%

Intricate modeling of HDD and reliability analysis in light of advances in Nanotechnology and MEMS

Pathak¹,

Ahmed²,

Joshi

2009

2009 Innovative Technologies in Intelligent Systems and Industrial Applications

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Abstract-We have demonstrated the impact of developments in nanotechnology to Hard Disk Drive (HDD) technology. We have put forth a proposition to enhance the modeling of future storage devices based on innovations in the field of Nanotechnology and MEMS. We have elucidated the influence of recent advances of Nano-Composites, MEMS (Micro Electro Mechanical Systems) etc. and their implications towards the development of storage devices in the future. We have discussed about reliability modeling, nano-physics modeling and thin-film polymer modeling of HDD technology on computer-aided engineering tools such as MATLAB. We have also devised a design of Nanotechnology and MEMS enabled future HDD. We have given a small model for array based MEMS cantilevers for HDD and have used SUGAR MEMS simulation library in MATLAB to model it. We have included the parameters to be kept in mind while modeling a HDD in light of the innovations in Nanotechnology and MEMS. Finally we have stated the working of a MEMS-based actuator and presented its reliability modeling.

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Determination of overwrite specification in thin-film head/disk systems

Cited by 12 publications

References 13 publications

Overwrite in thin film disk recording systems

Overwrite in thin film disk recording systems

Magnetic Recording Heads

Intricate modeling of HDD and reliability analysis in light of advances in Nanotechnology and MEMS

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