Developing High Confinement and Low-loss Silicon Nitride Photonic Devices for Optical Coherence Tomography (Invited)

Abstract

There is a surging interest in developing integrated Optical Coherence Tomography (OCT) system. However, most components are based on silicon which cannot be used for wavelength below 1.2 μm. Here, we discuss the potential of using Si3N4 photonic devices for OCT.