Abstract:Analog-to-digital converters (ADCs) are moving toward high speed and high resolution for low-cost testing. Based on the theory of intelligent sensor network, this paper designs a low-cost test solution for high-precision ADC chips, which solves the problems related to signal integrity. It mainly includes the following: designing an appropriate circuit connection scheme, planning an appropriate PCB stack-up structure, formulating detailed layout and wiring constraints, etc., and building a high-speed ADC test p… Show more
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