2023
DOI: 10.1002/sia.7242
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Development of a 2D digital proton–proton scattering technique for hydrogen depth profiling

Abstract: Measuring hydrogen concentration and determining its depth profile in different substrates has always been a major challenge for material science. Proton–proton scattering is a nondestructive technique for hydrogen analysis in thin samples. In this paper, the development of a 2D coincidence proton–proton spectroscopy was performed using a 3 MeV Van de Graaff accelerator. In the presented technique, the coincidence recording of the proton–proton scattering events by a waveform digitizer provides the sum‐differe… Show more

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