Device Design for a 12.3-Megapixel, Fully Depleted, Back-Illuminated, High-Voltage Compatible Charge-Coupled Device

Holland, Steven E.; Kolbe, W.; Bebek, C.

doi:10.1109/ted.2009.2030631

Cited by 34 publications

(22 citation statements)

References 26 publications

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“…5. The CCD is a 12 Megapixel fully depleted 650 µm thick device from the SNAP collaboration [15]- [17]. The scattering window is a 5 mm diameter, 14 µm thick aluminized mylar film.…”

Section: Methodsmentioning

confidence: 99%

CCD-based diagnostics for pulsed MeV photon beams

Zhang

Quiter

Barton

et al. 2014

2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

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Narrow bandwidth, MeV-level photon beams can be generated by Thomson scattering of laser light from fast electrons. Intense photon sources (> 1 MeV, 10 8 photons/shot) from laser plasma accelerated GeV electrons present the possibility for compact active interrogation devices. However, the characterization of such intense photon beams is inherently challenging due to mm-scale focusing and fs-scale pulse duration. A solution to the characterization of both spatial and energy distributions of each shot is to employ a low mass scattering material and track the scattered Compton electron's direction and energy. Following previous work at UC Berkeley with electron track Compton imaging in fully-depleted silicon CCDs, we present a measurement scheme for the shot-by-shot measurement of MeV photon beam position and energy.

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“…5. The CCD is a 12 Megapixel fully depleted 650 µm thick device from the SNAP collaboration [15]- [17]. The scattering window is a 5 mm diameter, 14 µm thick aluminized mylar film.…”

Section: Methodsmentioning

confidence: 99%

CCD-based diagnostics for pulsed MeV photon beams

Zhang

Quiter

Barton

et al. 2014

2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

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“…The distortion of field lines in the model in reference [2] (see Fig. 5) leads to the expectation of mismeasurement of object centroids when the object is near the CCD edge.…”

Section: Ccd Edge Effectsmentioning

confidence: 98%

Narrow-beam X-ray tests of CCD edge response

et al. 2010

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“…Considerably larger dispersion than this can be achieved by extending the spectral range, though with a reduced number of glasses available due to absorption effects. (Note that fully depleted silicon detector arrays allow working at high quantum efficiency over a 300–1000 nm range [44,45]. )…”

Section: Two-element Prisms: Linear and Nonlinear Design Approachesmentioning

confidence: 99%

Compound prism design principles, I

Hagen

Tkaczyk

2011

Appl. Opt.

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Prisms have been needlessly neglected as components used in modern optical design. In optical throughput, stray light, flexibility, and in their ability to be used in direct-view geometry, they excel over gratings. Here we show that even their well-known weak dispersion relative to gratings has been overrated by designing doublet and double Amici direct-vision compound prisms that have 14° and 23° of dispersion across the visible spectrum, equivalent to 800 and 1300 lines/mm gratings. By taking advantage of the multiple degrees of freedom available in a compound prism design, we also show prisms whose angular dispersion shows improved linearity in wavelength. In order to achieve these designs, we exploit the well-behaved nature of prism design space to write customized algorithms that optimize directly in the nonlinear design space. Using these algorithms, we showcase a number of prism designs that illustrate a performance and flexibility that goes beyond what has often been considered possible with prisms.

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Device Design for a 12.3-Megapixel, Fully Depleted, Back-Illuminated, High-Voltage Compatible Charge-Coupled Device

Cited by 34 publications

References 26 publications

CCD-based diagnostics for pulsed MeV photon beams

CCD-based diagnostics for pulsed MeV photon beams

Narrow-beam X-ray tests of CCD edge response

Compound prism design principles, I

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