Differential absorption imaging for elemental analysis of thin samples using a soft laser-plasma X-ray source

Laville, S.; Gizzi, L. A.; Köster, P.; Labate, L.

doi:10.1016/j.nima.2004.09.004

Cited by 2 publications

(2 citation statements)

References 17 publications

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“…In order to highlight the sensitivity of the technique, we compare Eq. 3and (6) with their equivalents using the conventional absorption edge contrast technique [5,6]. Defining the normalized absorption in the conventional absorption edge contrast technique as…”

Section: The Multi-wavelength Elemental Contrast Absorption Techniquementioning

confidence: 99%

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Multi-wavelength elemental contrast absorption imaging

et al. 2011

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We report experimental demonstrations of a quantitative technique for elemental mapping. The technique operates in full-field imaging mode and uses three intensity measurements at energies across an absorption edge of an element of interest to obtain its elemental distribution. The experimental results show that the technique can overcome some limitations in the conventional Absorption Edge Contrast Imaging. The technique allows for an accurate determination of the elemental distribution in a compound sample even at a low level of percentage composition. It is also robust to the choice of energy intervals.

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Section: The Multi-wavelength Elemental Contrast Absorption Techniquementioning

confidence: 99%

“…The most common X-ray full-field imaging technique with elemental mapping capability is the so called Absorption-Edge Contrast Imaging [5,6]. Here the contrast of an element of interest in a compound sample is obtained by normalising the intensities measured at two energies above and below an absorption edge of a given element.…”

Section: Introductionmentioning

confidence: 99%

Multi-wavelength elemental contrast absorption imaging

et al. 2011

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At-focus scanning ptychography for high resolution imaging with a wide field of view

Ivanic,

Barolak,

Car

et al. 2024

Opt. Express

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From manufacturing to medicine, there is a demand for phase-resolved, high resolution imaging of large samples. Here we present at-focus scanning ptychography (AFSP), a novel ptychographic metrology station designed for high resolution imaging over a large field of view. AFSP builds on scanning ptychography, but samples remain stationary during the imaging process, allowing for in-situ imaging. We demonstrate a resolution of 44.19μm, present images of spherical and freeform optics with a FOV of over 4cm, and validate the fidelity of the AFSP system by comparing it to established commercial instruments. AFSP’s comparable performance underscores its credibility as a valuable addition to quantitative phase imaging technologies.

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Differential absorption imaging for elemental analysis of thin samples using a soft laser-plasma X-ray source

Cited by 2 publications

References 17 publications

Multi-wavelength elemental contrast absorption imaging

Multi-wavelength elemental contrast absorption imaging

At-focus scanning ptychography for high resolution imaging with a wide field of view

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