2015
DOI: 10.1016/j.measurement.2015.07.025
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Differential Thickness Layer Resistance Measurement method for measurements of contact resistance of organic semiconductor thin films

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Cited by 4 publications
(2 citation statements)
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“…73 Other experimental methods to lower R S include decreasing the contact resistance between the active layer and electrodes 74 or creating donor−acceptor interfaces that interact well. 75 From Figure 15a, SnO 2 ETL-based SC structures demonstrated the lowest values of both PCE and FF. The highest value of PCE is exhibited by WS 2 and PCBM ETL-based PSCs for the chosen range of R s .…”
Section: Effect Of Interface Properties 371 Effect Of Defect Density ...mentioning
confidence: 95%
“…73 Other experimental methods to lower R S include decreasing the contact resistance between the active layer and electrodes 74 or creating donor−acceptor interfaces that interact well. 75 From Figure 15a, SnO 2 ETL-based SC structures demonstrated the lowest values of both PCE and FF. The highest value of PCE is exhibited by WS 2 and PCBM ETL-based PSCs for the chosen range of R s .…”
Section: Effect Of Interface Properties 371 Effect Of Defect Density ...mentioning
confidence: 95%
“…However, thickness reduction is not always a useful choice, especially for organic solar cells, in which a non-complementary photo-absorption is yielded when the thickness of the devices is kept below 200 nm [ 26 , 27 ]. Other experimental approaches to reduce R s can be achieved through a well interplayed donor-acceptor interfaces [ 28 , 29 ] or by minimizing the contact resistance between the electrodes and active layer [ 30 ].…”
Section: Resultsmentioning
confidence: 99%