Direct determination of trace amounts of silicon in polyamides by means of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry

Resano, Martín; Verstraete, M.; Vanhaecke, Frank; Moëns, Luc

doi:10.1039/b200749p

Cited by 21 publications

(18 citation statements)

References 32 publications

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“…130 Finally, electrothermal vaporization (ETV) ICP-MS was applied to quantify silicon in solid polyamide samples. 131 According to a comparison between other spectroscopic methods, Resano et al concluded that ETV-ICP-MS and ETAAS have approximately the same performance concerning detection limits in the solid sample (0.3 mg g À1 ). 131 De Schrijver et al have shown that the LODs considerably improved with direct solid sampling methods compared to those attainable after dissolution.…”

Section: Inductively Coupled Plasma Mass Spectrometry (Icp-ms)mentioning

confidence: 99%

Silicon speciation by hyphenated techniques for environmental, biological and industrial issues: A review

Chainet

Lienemann

Courtiade

et al. 2011

J. Anal. At. Spectrom.

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Silicon speciation in environmental, biological and industrial matrices is of considerable importance due to its wide use in many consumer and personal care products and industry. In addition, the entry of silicones in various compartments like wastes, soils, air and water highlights the need to perform exposure studies, toxicological surveys and to measure negative effects. Due to possible contamination and trace level presence of silicon compounds, challenges to determination, identification and quantification are presented. The principal species of concern include siloxanes, silanols, silanediols and silanes. State of the art of analytical methods for total silicon determination and silicon speciation are established. Atomic spectroscopic methods are mainly used to measure total Si at trace concentration levels. On the opposite, hyphenated techniques are performed for Si speciation. Particular attention is paid to chromatographic methods coupled to sensitive and selective detectors (MS, AED and ICP) allowing structural information. Liquid and gas chromatography emerge as the most widespread separation techniques. However, other procedures such as MS, NMR, IR and XRF enable a better knowledge of these species. The potential and limitations of hyphenated techniques are highlighted, particularly concerning sensitivity and selectivity. Furthermore, potential sources of contamination and analytical artifacts in silicon determination are reviewed.

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Section: Inductively Coupled Plasma Mass Spectrometry (Icp-ms)mentioning

confidence: 99%

Silicon speciation by hyphenated techniques for environmental, biological and industrial issues: A review

Chainet

Lienemann

Courtiade

et al. 2011

J. Anal. At. Spectrom.

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show abstract

“…The method was described as being convenient, rapid and accurate. Trace amounts of Si have been determined in polyamides using an ETV-ICP-MS technique in a paper by Resano et al 271 The effects of the vaporization temperature on the occurrence of interferences for all Si isotopes were evaluated, as was the presence of palladium as a chemical modifier. Optimum conditions were found to be a temperature of 2400 uC, use of 29 Si and with the addition of 1 mg of palladium.…”

Section: Polymeric Materials and Compositesmentioning

confidence: 99%

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

Fisher¹,

Goodall²,

Hinds³

et al. 2003

J. Anal. At. Spectrom.

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“…According to literature data [5,9,10], ammonia is the most appropriate reaction gas for ICP MS deter mination of silicon concentration by 28 Si isotope. According to the recommendations for gas selection provided in [12] and taking into account the thermo dynamic properties of gases provided in Table 2, direct determination of silicon by ICP MS using dynamic reaction cell can be also performed with oxygen, methane, and hydrogen.…”

Section: Methodsmentioning

confidence: 99%

“…They include the selection of the optimal param eters of mass spectrometer operation [2], modification of the composition of the plasma forming gas [3], use of alternative sample injection methods [4,5], direct separation by the isotope weights of the element and interfering ions using high resolution mass spectrome ters [6][7][8], elimination of polyatomic ions using devices for ion molecule reactions, dynamic reaction cells [9,10].…”

Section: Introductionmentioning

confidence: 99%

Using high resolution and dynamic reaction cell for the improvement of the sensitivity of direct silicon determination in uranium materials by inductively coupled plasma mass spectrometry

Golik¹,

Kuz'mina²,

Saprygin

et al. 2013

J Anal Chem

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Abstract-The paper describes solving the problem of direct silicon determination at low levels in uranium materials, caused by the spectral interferences of polyatomic ions and the high value of blank levels, using inductively coupled plasma mass spectrometry (ICP MS). To overcome the interference problem, two pri mary techniques have been applied: double focusing high resolution ICP MS and dynamic reaction cell (DRC) filled with highly reactive ammonia gas. All measurements were performed at high resolution (m/Δm = 4000) on an Element 2 mass spectrometer and pressurized mode of a dynamic reaction cell on an Elan DRC II mass spectrometer. The ways to reducing background levels are investigated. The effects of oper ating conditions, such as plasma parameters, DRC system original parameters, and uranium matrix influence on the analytical signals of silicon at m/z = 28 have been observed for different mass spectrometer types. The detection limits and the random error characteristics (relative standard deviation) of silicon determination in uranium materials were estimated.

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Direct determination of trace amounts of silicon in polyamides by means of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry

Cited by 21 publications

References 32 publications

Silicon speciation by hyphenated techniques for environmental, biological and industrial issues: A review

Silicon speciation by hyphenated techniques for environmental, biological and industrial issues: A review

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

Using high resolution and dynamic reaction cell for the improvement of the sensitivity of direct silicon determination in uranium materials by inductively coupled plasma mass spectrometry

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