“…For the intrinsic part of small‐signal modeling, the direct extraction method is commonly used, whereas other intrinsic circuit extraction methods are increasing like mixed extraction method [ 8 ] , semi analysis method [ 9 ] , numerical optimization method [ 10 ] , automatic extraction method [ 11 ] , etc. However, most of those improved methods depend on the complex measured datasheet, but direct extraction only needs scattering (S−) parameters under a bias condition [ 12 ] . Sensitivity analysis can improve the accuracy of the simple direct extraction method.…”