2006
DOI: 10.1016/j.jnoncrysol.2005.10.048
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Discrete defect levels in the amorphous selenium bandgap

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Cited by 15 publications
(17 citation statements)
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“…Therefore, in principle, two independent optical measurements are necessary at each spectral wavelength to solve for the unknowns and but, in practice, the true geometric thickness of the film is not known in prior and is thus to be determined at the same time-that is, three unknowns to be retrieved from two independent optical measurements at the same spectral wavelength, which demands adequate model suppositions or an otherwise optical analytical approach (Tan, 2006;Tan et al, 2007;Tan et al, 2006;Vautier et al, 1988;Bettstelleret al, 1993;Mulama et al, 2014;Benkhedir, 2006;Solieman et al, 2014;Adachi & Kao1980;Kotkata & Abdel-Wahab, 1990;Kotkata et al, 2009;Navarrete et al, 1990;Solieman & Abu-Sehly, 2010;Nagels et al, 1995;Tichy et al, 1996;Nagels et al, 1997;Tauc, 1972;Tauc, 1979;Heavens, 1991;Azzam & Bashara, 1987;Ward, 1994;Dragoman & Dragoman, 2002;Stenzel, 2005;Joo et al, 1999;Dobrowolski et al, 1983;Klein et al, 1990;Kukinyi et al, 1996;Chiao et al, 1995;Case, 1983;Peng & Desu, 1994;Birgin et al, 1999;Mulato et al, 2000;Erarslan & Gungor, 2010;Ventura et al, 2005;Manifacier et al, 1976;Swanepoel, 1983;Minkov, 1990;El-Naggar et al, 2009;…”
Section: Measurements and Analytical Techniques For Determining Opticmentioning
confidence: 99%
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“…Therefore, in principle, two independent optical measurements are necessary at each spectral wavelength to solve for the unknowns and but, in practice, the true geometric thickness of the film is not known in prior and is thus to be determined at the same time-that is, three unknowns to be retrieved from two independent optical measurements at the same spectral wavelength, which demands adequate model suppositions or an otherwise optical analytical approach (Tan, 2006;Tan et al, 2007;Tan et al, 2006;Vautier et al, 1988;Bettstelleret al, 1993;Mulama et al, 2014;Benkhedir, 2006;Solieman et al, 2014;Adachi & Kao1980;Kotkata & Abdel-Wahab, 1990;Kotkata et al, 2009;Navarrete et al, 1990;Solieman & Abu-Sehly, 2010;Nagels et al, 1995;Tichy et al, 1996;Nagels et al, 1997;Tauc, 1972;Tauc, 1979;Heavens, 1991;Azzam & Bashara, 1987;Ward, 1994;Dragoman & Dragoman, 2002;Stenzel, 2005;Joo et al, 1999;Dobrowolski et al, 1983;Klein et al, 1990;Kukinyi et al, 1996;Chiao et al, 1995;Case, 1983;Peng & Desu, 1994;Birgin et al, 1999;Mulato et al, 2000;Erarslan & Gungor, 2010;Ventura et al, 2005;Manifacier et al, 1976;Swanepoel, 1983;Minkov, 1990;El-Naggar et al, 2009;…”
Section: Measurements and Analytical Techniques For Determining Opticmentioning
confidence: 99%
“…The actual functional form of the DOS in band tails is somewhat difficult to specify adequately and is still controversial, but the transition in DOS function between the band region and tail region is a smooth one The energies and denote, respectively, the sharp edges of conduction and valence bands in the absence of structural disorder, while and are the broadening spreads of their respective tails into the semiconductor's bandgap that increase with increasing in its structural disorder. The energy terms 2 ⁄ and 2 ⁄ signify the transition points between the square-root and linear-exponential distribution of energy states within the bands and into the bandgap region, with their DOS functions g and g , with their first derivatives being continuous at these points (Benkhedir, 2006;Theiss, 2012;O'Leary et al, 1997;Dias da Silva et al, 2004). Let all band-tail energy states to be localized and all band energy states to be extended, the energy levels 2 ⁄ and 2 ⁄ represent the so-called mobility edges of the conduction and valence bands, respectively, with the energy difference 2 ⁄ is the mobility-edge bandgap energy, where is the Tauc absorption edge or Tauc bandgap energy in the disorderless limit-that is, when → 0 and → 0.…”
Section: The O'leary-johnson-lim (Ojl) Interband Transition Dielectrimentioning
confidence: 99%
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