2015 Euromicro Conference on Digital System Design 2015
DOI: 10.1109/dsd.2015.43
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Double Phase Fault Collapsing with Linear Complexity in Digital Circuits

Raimund Ubar
1
,
Lembit Jürimägi
2
,
E. Orasson
3
et al.
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Cited by 3 publications
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References 27 publications
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SAT-ATPG for application-oriented FPGA testing

Hulle
1
,
Fišer
2
,
Schmidt
3
et al. 2016
2016 15th Biennial Baltic Electronics Conference (BEC)
7
0
7
0
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SAT-ATPG for application-oriented FPGA testing

Hulle
1
,
Fišer
2
,
Schmidt
3
et al. 2016
2016 15th Biennial Baltic Electronics Conference (BEC)
7
0
7
0
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Evaluation of the SEU Faults Coverage of a Simple Fault Model for Application-Oriented FPGA Testing

Borecky
1
,
Hulle
2
,
Fišer
3
2020
2020 23rd Euromicro Conference on Digital System Design (DSD)
1
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Enhanced Test for Reconfigurable Hardware Systems Based on Sequential Logic

Ahmed
1
,
Mosbahi
2
,
Khalgui
3
2018
2018 IEEE 16th International Conference on Embedded and Ubiquitous Computing (EUC)
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