Dow Chemical: Materials Science Contributions to Membrane Production

Direct ellipsometry for non-destructive characterization of interfacially-polymerized thin-film composite membranes

“…A polysulfone ultrafiltration membrane (PS20, Sepro Membranes Inc., Oceanside, CA, USA) was used to evaluate the refractive index of a porous PSF support for SW-VAE measurements. The PS20 membrane was chosen because its support layer material is PSF which is utilized by the industry for the manufacturing of TFC RO membranes [22].…”