2011
DOI: 10.1016/j.scriptamat.2011.09.003
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Ductile fracture evaluated through micro-computed X-ray tomography

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Cited by 7 publications
(6 citation statements)
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“…Considering the microscopy (Gao et al, 2009) and X-ray tomography (Scheck and Zupan, 2011) data for Al 5083-H116, the use of f 0 ¼0.03 for the basis of our model corresponds to the assumption that all particles having a size greater than about 1 μm will nucleate voids. Bearing in mind that the particles and defects having submicron sizes are not expected to grow to become micron-sized voids under the influence of the yield stress at room temperature (Nguyen and Warner, 2012;Nair et al, 2011), the model already accounts for all the void nucleation events that could occur.…”
Section: Resultsmentioning
confidence: 99%
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“…Considering the microscopy (Gao et al, 2009) and X-ray tomography (Scheck and Zupan, 2011) data for Al 5083-H116, the use of f 0 ¼0.03 for the basis of our model corresponds to the assumption that all particles having a size greater than about 1 μm will nucleate voids. Bearing in mind that the particles and defects having submicron sizes are not expected to grow to become micron-sized voids under the influence of the yield stress at room temperature (Nguyen and Warner, 2012;Nair et al, 2011), the model already accounts for all the void nucleation events that could occur.…”
Section: Resultsmentioning
confidence: 99%
“…As discussed previously, the total particle volume fraction is used as the initial void volume fraction of the cell. This particle volume fraction is readily accessible though X-ray tomography and optical micrography; examples of characterization of this value can be seen in the work of Scheck and Zupan (2011) and Orlov et al (2009). The value of = f 0.03 0 for AL5083-H116 (Gao et al, 2009;Scheck and Zupan, 2011) is used in the current study.…”
Section: Microscale Materials Modelmentioning
confidence: 99%
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“…Recently, X-ray computed tomography has been widely applied to material science and engineering [9][10][11] and some researchers began to use this technology to analyze the powder-binder separation [12,13], because of its obvious advantages, including 3D and the non-destructive characterization of the spatial structure. In the previous studies, powder-binder separation was analyzed by using gray value distribution in the CT reconstructed data [14,15].…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, many observation tools, such as scanning electron microscope (SEM) and optical microscope (OM), were developed to perform the characterization of the microstructure in materials. Nowadays, as a new developed technology, X-ray tomography has been applied to many fields of material science and engineering [9][10][11][12][13][14]. In Refs.…”
Section: Introductionmentioning
confidence: 99%