2014
DOI: 10.1007/s10836-014-5472-6
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Dynamic X-filling for Peak Capture Power Reduction for Compact Test Sets

Abstract: Excessive test power consumption is one of the obstacles which the chip industry currently faces. Peak capture power reduction typically leads to high pattern counts which increase test costs. This paper proposes a new methodology to reduce peak capture power during at-speed scan testing. In this method, a novel dynamic Xfilling technique Opt-Justification-fill which uses optimization techniques to compute promising X-bits for low-power filling is proposed. This method is tightly integrated into a dynamic comp… Show more

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Cited by 3 publications
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