Dynamics Displayed by Energetic C<sub>60</sub> Bombardment of Metal Overlayers on an Organic Substrate

Kennedy, Paul E.; Postawa, Zbigniew; Garrison, Barbara J.

doi:10.1021/ac303348y

Cited by 3 publications

(7 citation statements)

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“…The animations show that the molecules can easily be displaced only along the crater edge into empty spaces created by the same impact or along the edge of the roughened surface into preexisting empty spaces, created by previous impacts. This motion is quite apparent for the impact in the bottom of the valley (Figure 2e, f and Supporting Information Animation 3) where there is almost a jetting type motion 5 with molecules streaming up the sides of the pit. In fact, this type of motion allows the molecules to traverse a relatively large distance compared with the distance of interlayer mixing, where the molecules travel only between a layer and the adjacent ones.…”

Section: ■ Resultsmentioning

confidence: 95%

“…A unique aspect of cluster secondary ion mass spectrometry (SIMS) is the ability to depth profile through a molecular solid with chemical specificity. − There are systems for which depth profiling works well, such as trehalose, Irganox, cholesterol, Langmuir–Blodgett films, amino acids, and organic light emitting diodes (OLEDs) if the metal overlayer is delaminated first. Challenges do arise in depth profiling of some polymers and in heterogeneous systems, such as metal overlayers on organic solids , or prefabricated metal–organic systems . In addition, some systems exhibit a temperature effect in which the depth profile quality is significantly enhanced by cooling the sample. , These temperature effects clearly indicate that there is a long time scale process taking place in addition to the beam induced effects.…”

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confidence: 99%

“…1−3 There are systems for which depth profiling works well, such as trehalose, Irganox, cholesterol, Langmuir−Blodgett films, amino acids, and organic light emitting diodes (OLEDs) if the metal overlayer is delaminated first. Challenges do arise in depth profiling of some polymers 4 and in heterogeneous systems, such as metal overlayers on organic solids 5,6 or prefabricated metal−organic systems. 7 In addition, some systems exhibit a temperature effect in which the depth profile quality is significantly enhanced by cooling the sample.…”

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confidence: 99%

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Computed Molecular Depth Profile for C₆₀ Bombardment of a Molecular solid

2013

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Molecular dynamics (MD) simulations have been performed for 10 keV C60 bombardment of an octane molecular solid at normal incidence. The results are analyzed using the steady-state statistical sputtering model (SS-SSM) to understand the nature of molecular motions and to predict a depth profile of a δ-layer. The octane system has sputtering yield of ~150 nm(3) of which 85% is in intact molecules and 15% is fragmented species. The main displacement mechanism is along the crater edge. Displacements between layers beneath the impact point are difficult because the nonspherically shaped octane molecule needs a relatively large volume to move into and the molecule needs to be aligned properly for the displacement. Since interlayer mixing is difficult, the predicted depth profile is dominated by the rms roughness and the large information depth because of the large sputtering yield.

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Section: ■ Resultsmentioning

confidence: 95%

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Computed Molecular Depth Profile for C₆₀ Bombardment of a Molecular solid

2013

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“…The key issue in metal/organics depth profiling is the injection of metal atoms into organic layers [28]. In the systems analyzed here, Cr and Au atoms are recoiled from the metallic overlayer through the Tyr layer.…”

Section: Metal Injection In the Organic Layermentioning

confidence: 99%

Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions

Noël

Houssiau

2016

J. Am. Soc. Mass Spectrom.

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Abstract. The structures developed in organic electronics, such as organic light emitting diodes (OLEDs) or organic photovoltaics (OPVs) devices always involve hybrid interfaces, joining metal or oxide layers with organic layers. No satisfactory method to probe these hybrid interfaces physical chemistry currently exists. One promising way to analyze such interfaces is to use in situ ion beam etching, but this requires ion beams able to depth profile both inorganic and organic layers. Mono-or diatomic ion beams commonly used to depth profile inorganic materials usually perform badly on organics, while cluster ion beams perform excellently on organics but yield poor results when organics and inorganics are mixed. Conversely, low energy Cs + beams (<500 eV) allow organic and inorganic materials depth profiling with comparable erosion rates. This paper shows a successful depth profiling of a model hybrid system made of metallic (Au, Cr) and organic (tyrosine) layers, sputtered with 500 eV Cs + ions. Tyrosine layers capped with metallic overlayers are depth profiled easily, with high intensities for the characteristic molecular ions and other specific fragments. Metallic Au or Cr atoms are recoiled into the organic layer where they cause some damage near the hybrid interface as well as changes in the erosion rate. However, these recoil implanted metallic atoms do not appear to severely degrade the depth profile overall quality. This first successful hybrid depth profiling report opens new possibilities for the study of OLEDs, organic solar cells, or other hybrid devices.

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“…These observations have been qualitatively confirmed by molecular dynamics (MD) computer simulations. 39 These studies utilized thin Ag layers on top of an octatetraene crystal as a model. The calculations show that the Ag atoms are indeed implanted into the organic substrate.…”

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Depth Profiling of Metal Overlayers on Organic Substrates with Cluster SIMS

et al. 2013

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Molecular depth profiling of organic thin films by erosion with energetic cluster ion beams is a unique aspect of secondary ion mass spectrometry (SIMS) experiments. Although depth profiles of complex multilayer organic structures can be acquired with little damage accumulation and with depth resolution of <10 nm using either C60(+) or Arx(+) with x = 500-5000, hybrid materials consisting of both organic and inorganic layers often yield poor results. To unravel the factors that lead to this difficulty, we developed a model system composed of a thin gold layer of 1.4 to 3.5 nm deposited either on top of or sandwiched within a cholesterol thin film matrix which is several hundred nanometers thick. For these systems, the results show that by erosion with a 40 keV C60(+) beam, reliable depth profiles can always be acquired as indicated by the presence of a steady state molecular ion signal. During the erosion process, however, gold atoms from the gold overlayer are implanted into the cholesterol matrix beneath it, resulting in a reduced sputter yield, an increase in the amount of cholesterol fragmentation and an increase in the thickness of the cluster ion-induced altered layer. The results also show that the effects of the metal film on the organic substrate are independent of the gold film thickness once the film thickness exceeds 1.4 nm. In general, this model study provides mechanistic insight into the depth profiling of heterogeneous thin film structures and offers a possible path for improving the quality of the depth profiles by employing low energy atomic ion sputtering in the region of the metal layer.

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Dynamics Displayed by Energetic C₆₀ Bombardment of Metal Overlayers on an Organic Substrate

Cited by 3 publications

References 58 publications

Computed Molecular Depth Profile for C₆₀ Bombardment of a Molecular solid

Computed Molecular Depth Profile for C₆₀ Bombardment of a Molecular solid

Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions

Depth Profiling of Metal Overlayers on Organic Substrates with Cluster SIMS

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Dynamics Displayed by Energetic C60 Bombardment of Metal Overlayers on an Organic Substrate

Cited by 3 publications

References 58 publications

Computed Molecular Depth Profile for C60 Bombardment of a Molecular solid

Computed Molecular Depth Profile for C60 Bombardment of a Molecular solid

Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions

Depth Profiling of Metal Overlayers on Organic Substrates with Cluster SIMS

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Product

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Dynamics Displayed by Energetic C₆₀ Bombardment of Metal Overlayers on an Organic Substrate

Computed Molecular Depth Profile for C₆₀ Bombardment of a Molecular solid

Computed Molecular Depth Profile for C₆₀ Bombardment of a Molecular solid