Semiconductors - Growth and Characterization 2018
DOI: 10.5772/intechopen.71014
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E-ALD: Tailoring the Optoeletronic Properties of Metal Chalcogenides on Ag Single Crystals

Abstract: Technological development in nanoelectronics and solar energy devices demands nanostructured surfaces with controlled geometries and composition. Electrochemical atomic layer deposition (E-ALD) is recognized as a valid alternative to vacuum and chemical bath depositions in terms of growth control, quality and performance of semiconducting systems, such as single 2D semiconductors and multilayered materials. This chapter is specific to the E-ALD of metal chalcogenides on Ag single crystals and highlights the el… Show more

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Cited by 2 publications
(3 citation statements)
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“…To this aim, a potential of −1.6 V was applied to the working electrode for 1 minute, then, after the injection of a fresh buffer solution in the cell, a potential of −0.1 V was applied for 1 minute. Both the distribution valve and the cell were designed and realized in the workshop of the Applied Electrochemistry Lab of the University of Florence [10]. The potentials reported in this paper are referred to the Ag/AgCl (saturated KCl) reference electrode.…”
Section: Methodsmentioning
confidence: 99%
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“…To this aim, a potential of −1.6 V was applied to the working electrode for 1 minute, then, after the injection of a fresh buffer solution in the cell, a potential of −0.1 V was applied for 1 minute. Both the distribution valve and the cell were designed and realized in the workshop of the Applied Electrochemistry Lab of the University of Florence [10]. The potentials reported in this paper are referred to the Ag/AgCl (saturated KCl) reference electrode.…”
Section: Methodsmentioning
confidence: 99%
“…for 1 minute. Both the distribution valve and the cell were designed and realized in the workshop of the Applied Electrochemistry Lab of the University of Florence [10]. The potentials reported in this paper are referred to the Ag/AgCl (saturated KCl) reference electrode.…”
Section: Deposition Of Mo Atomicmentioning
confidence: 99%
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