Edge-illumination X-ray phase contrast imaging: matching the imaging method to the detector technology

Endrizzi, Marco; Diémoz, Paul C.; Hagen, Charlotte K.; Vittoria, Fabio A.; Munro, Peter; Rigon, Luigi; Dreossi, Diego; Arfelli, Fulvia; Lopez, F. C. M.; Longo, Renata; Marenzana, Massimo; Delogu, Pasquale; Vincenzi, A.; Ruvo, Luca de; Spandre, G.; Brez, A.; Bellazzini, R.; Olivo, Alessandro

doi:10.1088/1748-0221/9/11/c11004

Cited by 5 publications

(2 citation statements)

References 39 publications

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“…However, it requires the use of specific detectors, which means sacrificing the ability to use any detector technology. A first approach consists in the use of a detector with a sharp PSF, like that provided by some direct conversion detectors, as the 'refraction sensing' mechanism [118][119][120]. This approach has been used since some of the earliest embodiments of EI with synchrotron radiation (e.g.…”

Section: Edge-illumination In the Context Of Other X-ray Phase Contra...mentioning

confidence: 99%

Edge-illumination x-ray phase-contrast imaging

Olivo¹

2021

J. Phys.: Condens. Matter

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Although early demonstration dates back to the mid-sixties, x-ray phase-contrast imaging (XPCI) became hugely popular in the mid-90s, thanks to the advent of 3rd generation synchrotron facilities. Its ability to reveal object features that had so far been considered invisible to x-rays immediately suggested great potential for applications across the life and the physical sciences, and an increasing number of groups worldwide started experimenting with it. At that time, it looked like a synchrotron facility was strictly necessary to perform XPCI with some degree of efficiency—the only alternative being micro-focal sources, the limited flux of which imposed excessively long exposure times. However, new approaches emerged in the mid-00s that overcame this limitation, and allowed XPCI implementations with conventional, non-micro-focal x-ray sources. One of these approaches showing particular promise for ‘real-world’ applications is edge-illumination XPCI: this article describes the key steps in its evolution in the context of contemporary developments in XPCI research, and presents its current state-of-the-art, especially in terms of transition towards practical applications.

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Section: Edge-illumination In the Context Of Other X-ray Phase Contra...mentioning

confidence: 99%

Edge-illumination x-ray phase-contrast imaging

Olivo¹

2021

J. Phys.: Condens. Matter

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“…Edge illumination and coded-aperture are XPCI techniques capable of quantitative retrieval of absorption, phase [11], and ultra-small-angle X-ray scattering [12]. They were shown to be incoherent and achromatic, enabling an efficient implementation also by using standard rotating anode X-ray tube sources [13][14][15]. They require two absorbing masks, with relatively large pitches, matched with the detector such that a one-to-one relationship exists between each of the apertures in the masks and columns of the detector pixels.…”

Section: Introductionmentioning

confidence: 99%

Laboratory-based edge-illumination phase-contrast imaging: Dark-field retrieval and high-resolution implementations

Endrizzi

Diémoz

Hagen

et al. 2014

2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

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Abstract-Edge illumination is an X-ray phase-contrast imaging technique capable of quantitative retrieval of phase and amplitude images. The retrieval of the ultra-small-angle X-ray scattering was recently developed and implemented with the area-imaging counterpart of an edge-illumination system, sometimes referred to as coded-aperture. This is an incoherent and achromatic technique, well suited for translation of the potential of X-ray phase contrast imaging into efficient laboratory-scale setups. We report on recent advances of these developments along two main directions. One relates to the expansion of the technique with respect to the data analysis and corrections that are required when non-ideal optical elements are used and optimized sampling strategies. The second is directed towards high-resolution and high-energy implementations. A laboratory-based prototype for high-energy X-ray phase-contrast microscopy was built and its performance was modelled and experimentally characterized.

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"Edge illumination" in X-ray Phase Contrast Imaging

Munro¹,

Ignatyev²,

Diémoz³

et al. 2012

AIP Conference Proceedings

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Although early demonstration dates back to the mid-sixties, x-ray phase-contrast imaging (XPCI) became hugely popular in the mid-90s, thanks to the advent of 3rd generation synchrotron facilities. Its ability to reveal object features that had so far been considered invisible to x-rays immediately suggested great potential for applications across the life and the physical sciences, and an increasing number of groups worldwide started experimenting with it. At that time, it looked like a synchrotron facility was strictly necessary to perform XPCI with some degree of efficiency-the only alternative being micro-focal sources, the limited flux of which imposed excessively long exposure times. However, new approaches emerged in the mid-00s that overcame this limitation, and allowed XPCI implementations with conventional, non-micro-focal x-ray sources. One of these approaches showing particular promise for 'real-world' applications is edge-illumination XPCI: this article describes the key steps in its evolution in the context of contemporary developments in XPCI research, and presents its current state-of-the-art, especially in terms of transition towards practical applications.

show abstract

Edge-illumination X-ray phase contrast imaging: matching the imaging method to the detector technology

Cited by 5 publications

References 39 publications

Edge-illumination x-ray phase-contrast imaging

Edge-illumination x-ray phase-contrast imaging

Laboratory-based edge-illumination phase-contrast imaging: Dark-field retrieval and high-resolution implementations

"Edge illumination" in X-ray Phase Contrast Imaging

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