Effect of large-angle incidence on particle identification performance for light-charged (<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si2.svg" display="inline" id="d1e252"><mml:mrow><mml:mi>Z</mml:mi><mml:mo linebreak="goodbreak" linebreakstyle="after">≤</mml:mo><mml:mn>2</mml:mn></mml:mrow></mml:math>) particles by pulse shape analysis with a pad-type nTD silicon detector

Kawase, Shoichiro; Murota, Takuya; Fukuda, Hiroya; Oishi, Masaya; Kawata, Teppei; Kitafuji, Kentaro; Manabe, Seiya; Watanabe, Yukinobu; Nishibata, Hiroki; Go, Shintaro; Kai, Tamito; Nagata, Yuto; Muto, Taiga; Ishibashi, Yuichi; Niikura, Megumi; Suzuki, Daisuke; Matsuzaki, Teiichiro; Ishida, Katsuhiko; Mizuno, Rurie; Kitamura, Noritaka

doi:10.1016/j.nima.2023.168984

Nuclear Instruments and Methods in Physics Research Section A:

2024

DOI: 10.1016/j.nima.2023.168984

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Effect of large-angle incidence on particle identification performance for light-charged (Z≤2) particles by pulse shape analysis with a pad-type nTD silicon detector

Shoichiro Kawase,

Takuya Murota,

Hiroya Fukuda

et al.

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Effect of large-angle incidence on particle identification performance for light-charged (Z≤2) particles by pulse shape analysis with a pad-type nTD silicon detector

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