Effect of thickness on the optical properties change in Bi/As2S3 bilayer thin films

Abstract

Measurement of the refractive index dispersion of As2Se3 bulk glass and thin films prior to and after laser irradiation and annealing using prism coupling in the near-and mid-infrared spectral range Rev. Sci. Instrum. 82, 053103 (2011); 10.1063/1.3587616 Synthetic melanin thin films: Structural and electrical properties Abstract. Bilayer thin films of Bi/As 2 S 3 were prepared from Bi and As 2 S 3 by thermal evaporation technique under high vacuum. We have prepared three bilayer films of 905nm, 910nm and 915nm thickness with with As 2 S 3 as bottom layer (900nm) and Bi as top layer (5,10,15 nm). We have compared the optical changes due to the thickness variation of Bi layer on As 2 S 3 film. The changes were characterized by FTIR and XPS techniques.