2005
DOI: 10.1016/j.solmat.2004.08.009
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Effects of multi-defects at metal/semiconductor interfaces on electrical properties and their influence on stability and lifetime of thin film solar cells

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Cited by 43 publications
(37 citation statements)
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“…It is important at this point to comment on the unusual high Jsc values observed for these devices as shown in Table 1 and Figure 9. To do this, we recall the existence of several native defect/impurity levels within the energy bandgap of CdTe which are known to cause Fermi level pinning phenomenon at CdTe/metal interfaces [28,32,35]. Two of such impurity levels have been shown in the energy band diagram in Figure 3b for illustration.…”
Section: Resultsmentioning
confidence: 99%
“…It is important at this point to comment on the unusual high Jsc values observed for these devices as shown in Table 1 and Figure 9. To do this, we recall the existence of several native defect/impurity levels within the energy bandgap of CdTe which are known to cause Fermi level pinning phenomenon at CdTe/metal interfaces [28,32,35]. Two of such impurity levels have been shown in the energy band diagram in Figure 3b for illustration.…”
Section: Resultsmentioning
confidence: 99%
“…However, when the CdTe layer remains n-type after growth and post-growth treatment, a very different device is formed. Because of the Fermi level (FL) pinning at n-CdTe/metal interface [3,5] a large Schottky barrier (SB) can be formed at this interface. As a result, a CdS/CdTe/metal structure forms an n-n + SB structure with two PV active junctions.…”
Section: Introductionmentioning
confidence: 99%
“…A combination of the PEC and PL results indicates that the presence of carbon atoms in the CdTe grown with graphite anode tends to cause the movement of the Fermi level of the CdTe towards the valence band edge in the post-deposition annealing process as indicated in figure 8 (a), thereby making the material display p-type conductivity. This situation is also most likely encouraged by the Fermi level pinning phenomenon that is well-known to be pronounced in CdTe [29]. Table 4: Summary of defect levels observed in electrodeposited CdTe thin films using photoluminescence study at 80 K for CdTe grown using graphite anode and platinum anode [28].…”
Section: Photoelectrochemical (Pec) Cell Studymentioning
confidence: 99%