2021
DOI: 10.1007/s10854-021-05588-0
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Effects of the oxide/interface traps on the electrical characteristics in Al/Yb2O3/SiO2/n-Si/Al MOS capacitors

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Cited by 8 publications
(5 citation statements)
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“…The peaks at 55.6 eV and 54.8 eV for Se 3d5/2 and Se 3d3/2, respectively, are associated with Se 2− ions.Yb 4d orbitals consist of doublet peaks at 183.7 eV and 180.5 eV, showing the presence of Yb in the NPLs. Similar values are reported in literature by various groups[126,127].…”
supporting
confidence: 92%
“…The peaks at 55.6 eV and 54.8 eV for Se 3d5/2 and Se 3d3/2, respectively, are associated with Se 2− ions.Yb 4d orbitals consist of doublet peaks at 183.7 eV and 180.5 eV, showing the presence of Yb in the NPLs. Similar values are reported in literature by various groups[126,127].…”
supporting
confidence: 92%
“…Figure 1g illustrates the Yb 4d spectra fitted using the Gauss–Lorentz (G–L) function to seven peaks. [ 24 ] Since the Yb 2+ state has a filled 4f sub‐shell, any interaction between a hole and the 4f electrons can be disregarded. [ 24 ] The Yb 3+ oxidation level is greatly influenced by Coulomb interaction, leading to the observation of peaks around 185.9, 192.6, 199.1, and 205.3 eV.…”
Section: Materials Characterizationmentioning
confidence: 99%
“…[ 24 ] Since the Yb 2+ state has a filled 4f sub‐shell, any interaction between a hole and the 4f electrons can be disregarded. [ 24 ] The Yb 3+ oxidation level is greatly influenced by Coulomb interaction, leading to the observation of peaks around 185.9, 192.6, 199.1, and 205.3 eV. [ 24 ] The O 1s were analyzed using two G–L functions, as depicted in Figure 1h.…”
Section: Materials Characterizationmentioning
confidence: 99%
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