2024
DOI: 10.3390/mi15070885
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Efficient Modeling of Single Event Transient Effect with Limited Peak Current: Implications for Logic Circuits

Yujian Wang,
Hongliang Lu,
Caozhen Yang
et al.

Abstract: The problem that the conventional double-exponential transient current model (DE model) can overdrive the circuit, which leads to the overestimation of the soft error rate of the logic cell, is solved. Our work uses a new and accurate model for predicting the soft error rate that brings the soft error rate closer to the actual. The piecewise double-exponential transient current model (PDE model) is chosen, and the accuracy of the model is reflected using the Layout Awareness Single Event Multi Transients Soft … Show more

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