Electric Field Effects on Charge Conduction for LaMnO3 Controlled La0.7Ca0.3MnO3 Manganite

Interface based field effect configuration and charge conduction mechanisms for manganite thin film heterostructures

“…2. 31,36 These measurements have already been discussed earlier for the same manganite based heterostructure in ref. 31 and 36. In the present study, f-scan measurements were performed by tilting manganite layers in the (122) direction from the (002) manganite crystal plane with an angle w = 451.…”

“…o-scan patterns) recorded, separately, for the LCMO/LAO thin film and the LMO/LCMO/LAO system suggest granular structured lattices of both the thin layers having (100) crystallographically oriented grains. 36 Considerable difference between the FWHM values for both the LCMO/LAO thin film and LMO/LCMO/LAO structure strongly suggests that both the LMO and LCMO thin layers possess different granular structures. 36 The rocking curves also confirm that the epitaxial growth of the LMO thin layer over the surface of the LCMO thin film supports the crystallinity of the structure.…”

“…36 Considerable difference between the FWHM values for both the LCMO/LAO thin film and LMO/LCMO/LAO structure strongly suggests that both the LMO and LCMO thin layers possess different granular structures. 36 The rocking curves also confirm that the epitaxial growth of the LMO thin layer over the surface of the LCMO thin film supports the crystallinity of the structure. This can be ascribed to the double heating process that was provided to the studied manganite-manganite structure.…”

“…In order to prepare the presently targeted LMO/LCMO/LAO manganite-manganite structure consisting of a 50 nm LMO layer grown on a LCMO 100 nm thin film on a LAO (100) single crystalline substrate, the cost effective, simple and vacuum free CSD method was used by employing the acetate precursor route. 12,15,[31][32][33][34][35][36] For the growth of the 100 nm thick LCMO mixed valent manganite layer, the acetate precursor route was employed with different steps and parameters as described in earlier reports. [31][32][33] Similarly, the 50 nm thick LMO manganite layer was grown on the thin film of LCMO/LAO using the same acetate precursor based simple sol-gel method with the parameters and steps as listed in earlier reports.…”

“…This assumption can be supported by recently reported values of the rms surface roughness B1.79 nm and B1.43 nm for LMO and LCMO thin manganite layers, respectively, as derived from the atomic force microscopy (AFM) images for the same LMO/LCMO/LAO system under study. 36 The structural aspects of the presently studied LMO/LCMO/ LAO metal-insulator-manganite structure have been understood by performing X-ray diffraction (XRD) f-scan measurements using Cu Ka radiation. Two square silver (Ag) pads of size B1 mm  1 mm were deposited on LMO and LCMO manganite layers for carrying out R-T measurements (under different applied interface electric fields).…”