1997
DOI: 10.1016/s0040-6090(97)00526-9
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Electrical, optical and structural characteristics of indium-tin-oxide thin films deposited on glass and polymer substrates

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Cited by 93 publications
(38 citation statements)
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“…On thermal annealing at 250°C for 1.5 h the (2 2 2) reflections coalesced into a single strong (2 2 2) reflection at 30.9°. These observations are consistent with a preferentially oriented (2 2 2) crystalline plane of (tin-doped) indium oxide, In 2 O 3 [34][35][36][37]. ESEM examination of both the annealed and unannealed samples also reveals a polycrystalline film morphology.…”
Section: Resultssupporting
confidence: 77%
“…On thermal annealing at 250°C for 1.5 h the (2 2 2) reflections coalesced into a single strong (2 2 2) reflection at 30.9°. These observations are consistent with a preferentially oriented (2 2 2) crystalline plane of (tin-doped) indium oxide, In 2 O 3 [34][35][36][37]. ESEM examination of both the annealed and unannealed samples also reveals a polycrystalline film morphology.…”
Section: Resultssupporting
confidence: 77%
“…For example, simulations by Vora et al showed a 19.65 % increase in short circuit current (J SC ) for nanocylinder patterned solar cell (NCPSC) in which the ITO layer thickness was kept at 10 nm to minimize the parasitic Ohmic losses and simultaneously act as a buffer layer while helping to tune the resonance for maximum absorption [14]. TCOs such as the most established indium tin oxide (ITO), aluminum-doped zinc oxide (AZO) and zinc oxide (ZnO) are standard integral materials in current thin-film solar PV devices [15][16][17][18]. Bulk material properties for common TCOs including ITO have been well researched and documented for different processing conditions and substrates [15,16,[19][20][21][22][23]; however, this is not the case for ultra-thin TCOs.…”
Section: Introductionmentioning
confidence: 99%
“…TCOs such as the most established indium tin oxide (ITO), aluminum-doped zinc oxide (AZO) and zinc oxide (ZnO) are standard integral materials in current thin-film solar PV devices [15][16][17][18]. Bulk material properties for common TCOs including ITO have been well researched and documented for different processing conditions and substrates [15,16,[19][20][21][22][23]; however, this is not the case for ultra-thin TCOs. The few exceptions include Sychkova et al [24], who reported both optical and electrical properties of 9-80 nm ITO films deposited by pulsed DC sputtering varied with thickness and showed a general increase in resistivity with decrease in film thickness [24].…”
Section: Introductionmentioning
confidence: 99%
“…The results for ρ are in the same order of magnitude as for the thin films deposited by cathode magnetron sputtering [14]. According to [15], the sheet resistance, R s , of ITO films with thickness 50 − 100 nm is in the range 2 − 6 kΩ/sq. Taking into account that the relation between the real part of the conductivity, σ' and ε" is ,…”
Section: Resultsmentioning
confidence: 81%