Electrode Migration: A Review Article

Abstract

Cochlear implant (CI) is considered as safe, and effective surgical procedure for patients with Sensory Neural Hearing Loss (SNHL). The cochlear implant is an electronic device implanted behind the ear, with electrode arrays which are inserted into the Scala Tympani of the cochlea to stimulate the auditory pathway. The complications rate of cochlear implant surgery is very low, and more common in pediatrics. Furthermore, electrode migration is one of the complications which are defined as gradual slipping out of electrode from cochlea or extrusion from tympanic membrane. Data were being collected through search engines included PUBMED, Google Scholar, and BMJ. The process of sorting out of articles as per inclusion criteria which has an outcome related to electrode migration in post cochlear implant. After removal of duplicate studies, total of 12 articles were found eligible for review analysis. Electrode migration is more common as previously reported, it has shown that fixation techniques should be more reliable to avoid migration of electrode. The purpose of this study is to get a detailed review of electrode migration causes and prevalence in post cochlear implant patients and what factors can lead to migration intraoperative and post-operative cases.