Electromagnetic signatures: a virtual test and verification tool for soc signal integrity

Abstract

Analytical modelling of electromagnetic signatures (EMSs) for testing VLSI integrated circuits (ICs) will be considered. As crosstalk noise induced by IC interconnects is associated with a level or pattern of EMF, we approach the modelling of EM signatures by deriving an accurate analytical correlation between a given cross-talk noise voltage level and its associated EMF pattern variation, and defining a possible EMS for such a cross-talk noise voltage level.