Electromagnetically-induced Deformation of Functionalized Fabric

Abstract

This work investigates the deformation of charged fabric via external electromagnetic fields. A reduced-order model is constructed by combining a yarn-segment network representation with dynamic discrete/lumped charged-masses. The deformation of the fabric is dictated by solving a coupled system of differential equations for the motion of the lumped charged-masses, which are coupled through the yarn-segments. Initially, the effects of the electric and magnetic fields are analytically studied for the components (yarnsegment network and charged-masses) that comprise the model. Quantitative numerical simulations are then provided for the entire, assembled, larger-scale, coupled system, based on a computationally-efficient time-stepping algorithm. The model is relatively easy to implement and provides analysts with a straightforward tool to study electromagnetic fabric systems.

Microscale modeling of effective mechanical and electrical properties of textiles

“…In order to preserve the global and local properties of the woven yarn structure, while still reducing the degrees of freedom required, lattice network models are employed, such as the finite element‐oriented approach in Tan and the analytical model in Leech . Empirical damage laws and electromagnetic effects were incorporated into a network model in Zohdi . Advanced summation techniques for network models designed for electronic textiles and applied to atomistic lattice models were developed in Beex .…”