Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future

Abstract

Piezoresponse force microscopy (PFM) has emerged as a powerful and versatile tool for probing nanoscale phenomena in ferroelectric materials on the nanometer and micrometer scales. In this review, we summarize the fundamentals and recent advances in PFM, and describe the nanoscale electromechanical properties of several important ferroelectric ceramic materials widely used in memory and microelectromechanical systems applications. Probing static and dynamic polarization behavior of individual grains in PZT films and ceramics is discussed. Switching spectroscopy PFM is introduced as a useful tool for studying defects and interfaces in ceramic materials. The results on local switching and domain pinning behavior, as well as nanoscale fatigue and imprint mapping are presented. Probing domain structures and polarization dynamics in polycrystalline relaxors (PMN‐PT, PLZT, doped BaTiO3) are briefly outlined. Finally, applications of PFM to dimensionally confined ferroelectrics are demonstrated. The potential of PFM for studying local electromechanical phenomena in polycrystalline ferroelectrics where defects and other inhomogeneities are essential for the interpretation of their macroscopic properties is illustrated.

Magnetic Field‐Induced Ferroelectric Switching in Multiferroic Aurivillius Phase Thin Films at Room Temperature

“…67,68,69 PFM is based on the detection of a bias-induced piezoelectric surface deformation. 70 A conductive tip is brought into contact with a piezoelectric sample surface, and the tip deflection resulting from the expansion or contraction of the sample due to the applied bias is measured (Fig.…”

The influence of Mn substitution on the local structure of Na0.5Bi0.5TiO3 crystals: Increased ferroelectric ordering and coexisting octahedral tilts

“…As a result, different domain variants can be distinguished by variations in the contrast of PFM images. 52 Because of these advantages, PFM has been used to map the domain distributions of many ferroelectrics. [52][53][54][55] Here, we have used PFM to map the ferroelectric domain structures for Mn-NBT and have compared the images to those obtained for NBT.…”

Accessing intermediate ferroelectric switching regimes with time-resolved transmission electron microscopy

“…[15][16][17][18][19][20][21][22][23][24][25][26][27] One of the most notable techniques is piezoresponse force microscopy (PFM), which has given great insight into the nature of polarization switching in ferroelectric materials, including studies of nucleation at free surfaces 18 and in capacitor structures, 19 nucleation mechanisms, and domain wall dynamics. 20 Recent PFM experiments revealed the ability to directly observe domains in multiferroics and to control their switching behavior using electric fields.…”