Electron emission yield and charging process of alkali-silicate glass submitted to an electron beam under the varying temperature condition

Belhaj, Mohamed; Tondu, Thomas; Inguimbert, Virginie; Elsafi, B.; Fakhfakh, S.; Jbara, O.

doi:10.1016/j.nimb.2011.09.010

Cited by 14 publications

(11 citation statements)

References 25 publications

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“…The recorded current is associated with the leakage current directly from the target material and the image displacement current from the metallic target holder. 20 However, the leakage current should be dominant because we took the current measurements in a steady state condition. 20 In order to understand the observed flashover in the forward sweep, the experiment was also performed without the metallic clamp.…”

Section: Resultsmentioning

confidence: 99%

“…20 However, the leakage current should be dominant because we took the current measurements in a steady state condition. 20 In order to understand the observed flashover in the forward sweep, the experiment was also performed without the metallic clamp. Here, we did not find any flashover, indicating that the sudden change in surface polarity is strongly related to the leakage current from the top Au layer.…”

Section: Resultsmentioning

confidence: 99%

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Primary electron energy dependent flashover in surface polarity on Au films

Catalfano

Kanjilal

Al-Ajlony

et al. 2013

Journal of Applied Physics

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Primary electron energy (E p) dependent change in target current was studied on a grounded Au film in the range of 40 to 3500 eV. The current jumped suddenly from a negative to a positive value at $650 eV with increasing E p , while it disappeared in reverse sweep and with increasing substrate temperature. Detailed analysis suggests that E p dependent surface charging plays a pivotal role in flashover. Prior to critical E p in the forward sweep, a gradual shift of a double peaklike structure towards high kinetic energy region in the secondary electron spectra also confirms surface charging effect. V

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Section: Resultsmentioning

confidence: 99%

Section: Resultsmentioning

confidence: 99%

Primary electron energy dependent flashover in surface polarity on Au films

Catalfano

Kanjilal

Al-Ajlony

et al. 2013

Journal of Applied Physics

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“…The speed of the variant can be characterized by the parameter of time constant. Some reports [17][18][19] think that the relationship between the surface potential and irradiation time can be fitted using an exponential function…”

Section: Properties Of Dynamic Seymentioning

confidence: 99%

Dynamic secondary electron emission characteristics of polymers in negative charging process

Weng

Zhang

et al. 2016

Mod. Phys. Lett. B

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We studied the dynamic secondary electron emission (SEE) characteristics of a polyimide sample in negative charging process under electron bombardment. The time evolution of secondary electron yield (SEY) has been measured with a pulsed electron gun. The dynamic SEY, as well as the surface potential have been analyzed using a capacitance model. The shift in surface potential caused by the negative charge accumulation on the sample reduces the landing energy of the primary electrons (PEs), which in turn alters the SEY. The charging process tends to be stable when the landing energy of PEs reaches the secondary crossover energy where the corresponding SEY is 1. The surface potential has an approximately negative exponential relationship with the irradiation time. The total accumulated charge at the stable state is found to be proportional to the product of the sample capacitance and the difference between initial incident energy and the secondary crossover energy. The time constant of the exponential function is proportional to the ratio of final accumulated charge to the incident current.

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“…6,7 Many efforts have been made for charge neutralization and SEY measurement of insulators. [8][9][10][11][12][13][14][15][16][17][18][19][20] The measurement system with two electron guns could eliminate or weaken charge accumulation. [12][13][14][15] In addition to a pulsed electron gun for SEY measurement, the other low-energy (less than several eV) flood one was used to neutralize positive charges accumulated on the sample surface.…”

mentioning

confidence: 99%

“…Measurements based on a single pulsed electron gun were also reported. [16][17][18][19] Here, the PE energy E pe alternated for negative and positive charging, respectively, for charge compensation, and a Kelvin probe was simultaneously used to detect the potential variation at the sample surface so that positive charges could be effectively neutralized. These charge neutralization approaches are naturally sophisticated and of high cost, in spite of higher accuracy for SEY measurement.…”

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confidence: 99%

Note: A simple charge neutralization method for measuring the secondary electron yield of insulators

Weng

Cao

Zhao

et al. 2014

Review of Scientific Instruments

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We report on a simple and effective charge neutralization method for measuring the total electron-induced secondary electron yield of insulators in a measurement system with a single pulsed electron gun. In this method, the secondary electron collector is negatively biased with respect to the sample to force some emitted secondary electrons to return to the sample surface and therefore to neutralize positive charges accumulated in the sample during the previous measurement. The adequate negative bias is determined and the equilibrium state of negative charging is discussed. The efficacy of the method is demonstrated by the measured electron yields in the cases with and without charge neutralization and by comparison with existing electron yield data of polyimide.

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Electron emission yield and charging process of alkali-silicate glass submitted to an electron beam under the varying temperature condition

Cited by 14 publications

References 25 publications

Primary electron energy dependent flashover in surface polarity on Au films

Primary electron energy dependent flashover in surface polarity on Au films

Dynamic secondary electron emission characteristics of polymers in negative charging process

Note: A simple charge neutralization method for measuring the secondary electron yield of insulators

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