Electron energy loss spectroscopy and energy filtered transmission electron microscopy of hydrogenated nano-crystalline Si thin films deposited via hydrogen profiling during hot-wire CVD for application in photovoltaics

Free electron laser stochastic spectroscopy revealing silicon bond softening dynamics

“…The Pauli blocking effects [65,66] induced by optical pumping (with photon energy larger than the band gap) are described in Figs. 3(b) and 3(e) for preedge and postedge situations, respectively.…”

“…Besides the remarkable data quality, we observed different ratios among the relative amplitude of the L 2 and L 3 edges in the four cases. This can be ascribed to the high sensitivity of this parameter to the chemical and structural environment of the Si atoms [62][63][64][65], added to the fact that the measurements were performed on different Si membranes, although nominally identical, that may have been affected by different contamination levels.…”