Electron-impact direct double ionization as a sequence of processes

Jonauskas, V.; Prancikevičius, A.; Masys, Šarūnas; Kynienė, Aušra

doi:10.1103/physreva.89.052714

Cited by 34 publications

(30 citation statements)

References 27 publications

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“…The only available theoretical work available in the literature obtained by Jonauskas et al 69 predicted a larger peak cross section than our calculation and all available experimental measurements [66][67][68] . A large discrepancy can also found near the ionization threshold for the total double ionization cross section obtained by Jonauskas et al 69 .…”

Section: A Electron Impact Double Ionizationmentioning

confidence: 48%

“…[10] dominated by the KO mechanisms of direct double ionization, while SO gradually plays a role with increasing incident energy. Jonauskas et al 69 overestimated the double ionization cross section around the peak value and their theoretical double ionization threshold is also larger than the experimental value. Our results represent the best understanding on the electron impact double ionization of C + , N + and O + .…”

Section: A Electron Impact Double Ionizationmentioning

confidence: 89%

“…In Fig. 5 we compare the electron impact double ionization integral cross sections for the ground term of C + with the experimental [66][67][68] as well as other theoretical results 69 . From the inspection of this figure, there is an excellent agreement between our theory and the most recent experimental results obtained by Lecointre et al 68 from the double ionization threshold to an incident electron energy of 200 eV.…”

Section: A Electron Impact Double Ionizationmentioning

confidence: 95%

“…For these ions, no close-coupling calculations have been carried out up to now. Recently, Jonauskas et al 69 investigated the electron impact double ionization cross section of C + and O + by presenting the process as a sequence of two-and three-step processes arising from ionization-ionization, ionization-excitation-ionization, and excitation-ionization-ionization processes.…”

Section: A Electron Impact Double Ionizationmentioning

confidence: 99%

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A practical theoretical formalism for atomic multielectron processes: direct multiple ionization by a single auger decay or by impact of a single electron or photon

Liu

Zeng

Yuan

2018

J. Phys. B: At. Mol. Opt. Phys.

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Multiple electron processes occur widely in atoms, molecules, clusters, and condensed matters when they are interacting with energetic particles or intense laser fields. Direct multielectron processes are the most involved among the general multiple electron processes and are the most difficult to describe theoretically. In this work, a unified and accurate theoretical formalism is proposed on the direct multielectron processes of atoms including the multiple Auger decay and multiple ionization by an impact of an energetic electron or a photon based on the atomic collision theory described by a correlated manybody Green's function. Such a practical treatment is made possible due to different coherence features of the particles (matter waves) in the initial and final states. We first explain how the coherence characteristics of the ejected continuum electrons is largely destructed, by taking the electron impact direct double ionization process as an example. This process is completely different from the single ionization where the complete interference can be maintained. The detailed expressions are obtained for the energy correlations among the continuum electrons and energy resolved differential and integral cross sections according to the separation of knock-out and shake-off mechanisms for the electron impact direct double ionization, direct double and triple Auger decay, and double and triple photoionization processes. Extension to higherorder direct multielectron processes than triple ionization is straight forward by adding contributions of following knock-out and shake-off processes. The approach is applied to investigate the electron impact double ionization processes of C + , N + , and O + , the direct double and triple Auger decay of the K-shell excited states of C + 1s2s 2 2p 2 2 D and 2 P , and the double and triple photoionization of lithium. Comparisons with available experimental and theoretical results show that our proposed theoretical formalism is accurate and effective in treating the atomic multielectron processes.

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Section: A Electron Impact Double Ionizationmentioning

confidence: 48%

Section: A Electron Impact Double Ionizationmentioning

confidence: 89%

Section: A Electron Impact Double Ionizationmentioning

confidence: 95%

Section: A Electron Impact Double Ionizationmentioning

confidence: 99%

See 2 more Smart Citations

A practical theoretical formalism for atomic multielectron processes: direct multiple ionization by a single auger decay or by impact of a single electron or photon

Liu

Zeng

Yuan

2018

J. Phys. B: At. Mol. Opt. Phys.

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“…(e, 3e) process, in the 40 − 60 eV energy range, evidencing different ionization channels at play. This so-called discontinuity is a crossover between the direct and the indirect processes [7]. The double ionization crossover has been observed for a wide variety of targets other than Mg: Be-like ions like B + [8,9], Ba [10,11], Ca and Sr [4,12], Ar and Xe ions [13,14] (see also Ref.…”

Section: Introductionmentioning

confidence: 99%

Single and double ionization of magnesium by electron impact: A classical study

et al. 2017

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International audienceWe consider electron impact-driven single and double ionization of magnesium in the 10-100 eV energy range. Our classical Hamiltonian model of these (e, 2e) and (e, 3e) processes sheds light on their total cross sections and reveals the underlying ionization mechanisms. Two pathways are at play in single ionization: Delayed and direct. In contrast, only the direct process is observed in double ionization, ruling out the excitation-autoionization channel. We also provide evidence that the so-called TS2 (Two-Step 2) mechanism predominates over the TS1 (Two-Step 1) mechanism, in agreement with experiments

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