2018
DOI: 10.1016/bs.aiq.2017.02.002
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Electron-Impact Ionization Cross Sections for Inner L - and M -Subshells of Atomic Targets at Relativistic Energies

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Cited by 7 publications
(16 citation statements)
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“…[40] and other theoretical calculations. Our results for both Ar and Cu are close to the results from the quantum calculations [28,31] as well as with other theoretical findings [4]. It is observed that the LSICS of Cu atom agree well with the experimental data and reasonably with other calculations for all subshells.…”
Section: Resultssupporting
confidence: 91%
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“…[40] and other theoretical calculations. Our results for both Ar and Cu are close to the results from the quantum calculations [28,31] as well as with other theoretical findings [4]. It is observed that the LSICS of Cu atom agree well with the experimental data and reasonably with other calculations for all subshells.…”
Section: Resultssupporting
confidence: 91%
“…Our present MVE model is compared with the previously available semi-empirical model DM of Deutsch et al [7], RPWBA of Scofield [28], PWBA of Khare and Wadehra [29], the quantum calculations SDWBA of Bote and Salvat [31] and SCADW of Pindzola [32,33]. Our calculated results from the XMUIBED [4], XMCN [4], MUIBED [23], XCVTS [26] and GKLV [20] models are also shown for comparison. [40] and other theoretical calculations.…”
Section: Resultsmentioning
confidence: 93%
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“…A similar effect was also observed by Haque et al., where the SE yield was strongly dependent on the surface properties. [ 82 ]…”
Section: Resultsmentioning
confidence: 99%
“…Low SEY materials or surfaces are aimed for reduction of surface charging of spacecrafts and satellites [1,2] as well as to mitigate formation of electron clouds in particle accelerators. [3][4][5][6][7] The primary electron energy dependence of the secondary electron yield as well as the kinetic energy distribution of the emitted electrons are subject of intensive studies since decades for elemental material surfaces and compounds [7][8][9][10][11][12][13][14][15][16][17] to accommodate the progressively developing technology demands. For many applications a SEY maximum below unity is sufficient to avoid cascade multiplication of the impinging electrons.…”
Section: Introductionmentioning
confidence: 99%