Emittance measurements of gallium liquid-metal ion sources

Alton, G.D.; Read, P.M.

doi:10.1016/0168-583x(91)95481-r

Cited by 16 publications

(3 citation statements)

References 24 publications

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“…Even though the beam emitted from an LMIS has a large divergence [18,19], it can be used to generate beams with very low transverse emittance, since it originates from a spot with diameter of less than 100 nm. We restrict the beam to a 2-mm diameter aperture in a distance of 200 mm from the emitter and estimate a normalized emittance of 10-50 π mm mrad √ eV by comparing the transmission through the pinhole with the divergence angles measured with a similar LMIS [7,20].…”

Section: Methodsmentioning

confidence: 99%

Transition Frequencies and Hyperfine Structure in $^{113,115}$In$^+$: Application of a Liquid-Metal Ion Source for Collinear Laser Spectroscopy

König,

Krämer,

Imgram

et al. 2020

Preprint

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We demonstrate the first application of a liquid-metal ion source for collinear laser spectroscopy in proof-of-principle measurements on naturally abundant In + . The superior beam quality, i.e., the actively stabilized current and energy of a beam with very low transverse emittance, allowed us to perform precision spectroscopy on the 5s 2 1 S0 → 5s5p 3 P1 intercombination transition in 115 In + , which is to our knowledge the slowest transition measured with collinear fluorescence laser spectroscopy so far. By applying collinear and anticollinear spectroscopy, we improved the center-ofgravity frequency νcg = 1 299 617 759. 3 (1.2) and the hyperfine constants A = 6957.19 (28) MHz and B = −443.7 (2.4) MHz by more than two orders of magnitude. A similar accuracy was reached for 113 In + in combination with literature data and the isotope shift between both naturally abundant isotopes was deduced to ν( 113 In) − ν( 115In) = 696.3 (3.1) MHz. Nuclear alignment induced by optical pumping in a preparation section of the ion beamline was demonstrated as a pump-andprobe approach to provide sharp features on top of the Doppler broadened resonance profile.

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Section: Methodsmentioning

confidence: 99%

Transition Frequencies and Hyperfine Structure in $^{113,115}$In$^+$: Application of a Liquid-Metal Ion Source for Collinear Laser Spectroscopy

König,

Krämer,

Imgram

et al. 2020

Preprint

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“…2 Therefore, emittance for a beam fraction is estimated by area emittance method. 8 By using the elliptical exclusion method developed by the ORNL Laboratory, 9 area emittance is calculated from measured emittance accurately. From the result, brightness of ion beams is estimated in the range of 10 pA to 10 nA of beam currents as shown in Fig.…”

Section: A Estimation Of Brightness Of the Aspismentioning

confidence: 99%

Brightness enhancement of plasma ion source by utilizing anode spot for nano applications

Park

Lee

Kim

et al. 2012

Review of Scientific Instruments

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Anode spots are known as additional discharges on positively biased electrode immersed in plasmas. The anode spot plasma ion source (ASPIS) has been investigated as a high brightness ion source for nano applications such as focused ion beam (FIB) and nano medium energy ion scattering (nano-MEIS). The generation of anode spot is found to enhance brightness of ion beam since the anode spot increases plasma density near the extraction aperture. Brightness of the ASPIS has been estimated from measurement of emittance for total ion beam extracted through sub-mm aperture. The ASPIS is installed to the FIB system. Currents and diameters of the focused beams with∕without anode spot are measured and compared. As the anode spot is turned on, the enhancement of beam current is observed at fixed diameter of the focused ion beam. Consequently, the brightness of the focused ion beam is enhanced as well. For argon ion beam, the maximum normalized brightness of 12,300 A∕m(2) SrV is acquired. The ASPIS is applied to nano-MEIS as well. The ASPIS is found to increase the beam current density and the power efficiency of the ion source for nano-MEIS. From the present study, it is shown that the ASPIS can enhance the performance of devices for nano applications.

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“…Emittance measurements were made by Alton and Read [Alton, 1989a[Alton, , 1989b[Alton, , 1991 using a Ga LMIS which confinn this result; the beam was limited to a current of 0.1 nA, which would correspond to the highly apertured beam in a high resolution focusing system, i.e., one suffering relatively little from aberrations in the imaging. It was found that the corresponding unnonnalized brightness was approximately 10 7 A cm-2 sr -I.…”

Section: Optical Properties Of the Lmismentioning

confidence: 99%