Enhanced electrical and fatigue properties of La-modified (100)-oriented PZT thin films with various Zr/Ti ratio

Wang, Xing; Zhou, Jiangang; Qi, Liping; Chen, Da; Wang, Qiusen; Dou, Jiao; Wang, Fuan; Zou, Helin

doi:10.1007/s10854-018-00636-8

Cited by 2 publications

(3 citation statements)

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“…Some oxides, e.g., PbO, TiO 2 , ZrO 2 , that are part of PZT have unique electrophysical and mechanical characteristics and a nanoscale structure in the case of the formation of thin layers [5,6,7,8]. PZT is interesting because it allows almost all applications of ferroelectrics to be covered due to the fact that, depending on the composition [9] and the alloying additives [10,11], it is possible to synthesize PZT with varied physical properties and material parameters over a very wide range while adapting them to the requirements of the specific practical application. Such properties are associated with high dielectric permeability and residual polarization, a large number of transition cycles, high breakdown voltage, pyroelectric and piezoelectric effects, electro-optical phenomena, photoelectricity, etc.…”

Section: Introductionmentioning

confidence: 99%

“…Because of the wide variety of processes involved in the formation of the microstructure and the properties of PZT, various research groups still continue to investigate the PZT material [11,12,13,14,15].…”

Section: Introductionmentioning

confidence: 99%

“…The variety of studies to control the properties and the structure of PZT based films can be divided into several branches. The first is to control the properties and the structure of PZT films by manipulating their stoichiometry and impurities [10,11]. The second is the production of epitaxial films [16].…”

Section: Introductionmentioning

confidence: 99%

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Microstructure and Properties of PZT Films with Different PbO Content—Ionic Mechanism of Built-In Fields Formation

et al. 2019

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Experimental studies were conducted on the effects of lead oxide on the microstructure and the ferroelectric properties of lead zirconate-titanate (PZT) films obtained by the method of radio frequency (RF) magnetron sputtering of a ceramic PZT target and PbO2 powder with subsequent heat treatment. It is shown that the change in ferroelectric properties of polycrystalline PZT films is attributable to their heterophase structure with impurities of lead oxide. It is also shown that, even in the original stoichiometric PZT film, under certain conditions (temperature above 580 °C, duration greater than 70 min), impurities of lead oxide may be formed. The presence of a sublayer of lead oxide leads to a denser formation of crystallization centers of the perovskite phase, resulting in a reduction of the grain size as well as the emergence of a charge on the lower interface. The formation of the perovskite structure under high-temperature annealing is accompanied by the diffusion of lead into the surface of the film. Also shown is the effect of the lead ions segregation on the formation of the self-polarized state of thin PZT films.

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