Enhanced field emission from lanthanum hexaboride coated multiwalled carbon nanotubes: Correlation with physical properties

Patra, Rajkumar; Ghosh, Santanu; Sheremet, Evgeniya; Jha, Menaka; Rodriguez, Raúl D.; Lehmann, Daniel; Ganguli, Ashok K.; Schmidt, Heidemarie; Schulze, Steffen; Hietschold, Michael; Zahn, Dietrich R. T.; Schmidt, Oliver G.

doi:10.1063/1.4898352

Cited by 25 publications

(13 citation statements)

References 39 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The Ohmic contact and the two‐stage field enhancement together increase the overall field emission performance. A few more recent studies in this domain are cited here and some significant studies are listed in Table .…”

Section: Enhancement (Sources)mentioning

confidence: 99%

Electron Emission Devices for Energy‐Efficient Systems

Nirantar

Ahmed

Bhaskaran

et al. 2019

Advanced Intelligent Systems

View full text Add to dashboard Cite

Artificial intelligence platforms, high-speed computation, and data handling systems increasingly need energy-efficient systems. Electron emission was fundamental to the development of transistors and electronics over seven decades ago. This technology has a renewed emergence and includes implications in diverse fields ranging from electronics, telecommunication, defense, space exploration, medical science, and material science to televisions and displays. For such a vital field, a critical review of theories, current research directions, applications, and future prospects is invaluable. Herein, the ongoing research directions adopted to enhance the emitter performance are reviewed and the relative degree of their success is compared. This is supported by an overview of key electron emission, transport mechanisms, and ways to tune a particular mechanism for energy-efficient applications. The diverse range of applications in this field, with a particular focus on electronics, is outlined. Exciting current developments in electron field emission that could revolutionize the electronic industry with a resurgence of nanoscale field emission transistor in the air medium are also discussed. Figure 2. Representation of different electron emission mechanisms: a) Comparison of thermionic emission, Schottky emission, FN tunnelling, and direct tunnelling with schematic energy band diagram. b) Typical thermionic emission plot. c) Typical Schottky plot. (b,c)Reproduced with permission. [3]

show abstract

Section: Enhancement (Sources)mentioning

confidence: 99%

Electron Emission Devices for Energy‐Efficient Systems

Nirantar

Ahmed

Bhaskaran

et al. 2019

Advanced Intelligent Systems

View full text Add to dashboard Cite

show abstract

“…Moreover, the enhancement in effective emissive area can also contribute to enhanced FE current density. The metal decoration on the CNT surface protects the CNT surface especially tip apex from oxidation [21,39], thus extends the life of metal decorated CNT cathode.…”

Section: Resultsmentioning

confidence: 99%

“…The fluctuation in current density (cf) is calculated using the following formula [39]. where x is the maximum deviation from the mean value x−.…”

Section: Resultsmentioning

confidence: 99%

Improved field emission from indium decorated multi-walled carbon nanotubes

Sreekanth

Ghosh

Biswas

et al. 2016

Applied Surface Science

Self Cite

View full text Add to dashboard Cite

“…Nonlinear behavior in FN plots have been reported in several recent CFE experiments [20][21][22][23][24][25][26], where the discussion of their results were based on the elementary FN equation. Moreover, we pondered that some of the results have showed do not pass the orthodoxy test, and cannot to be interpreted only on the light of the results of the present work (which consider only orthodox field emission), despite similar forms of FN plots have been obtained.…”

Section: Current Density Calculations Model and Previous Workmentioning

confidence: 99%

The consequences of dependence between the formal area efficiency and the macroscopic electric field on linearity behavior in Fowler–Nordheim plots

Assis¹,

Dall’Agnol²,

Andrade³

2016

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

This work presents a theoretical explanation for a crossover in the linear behavior in FowlerNordheim (FN) plots based on cold field electron emission (CFE) experimental data. It is characterized by a clear change in the decay rate of usually single-slope FN plots, and has been reported when non-uniform nano-emitters are subject to high macroscopic electric field FM . We assume that the number of emitting spots, which defines an apparent formal area efficiency of CFE surfaces, depends on the macroscopic electric field. Non-uniformity is described by local enhancement factors {γj}, which are randomly assigned to each distinct emitter of a conducting CFE surface, from a discrete probability distribution ρ(γj), with j = 1, 2. It is assumed that ρ(γ1) < ρ(γ2), and that γ1 > γ2. The local current density is evaluated by considering a usual Schottky-Nordheim barrier. The results reproduce the two distinct slope regimes in FN plots when FM ∈ [2, 20] V/µm and are analyzed by taking into account the apparent formal area efficiency, the distribution ρ, and the slopes in the corresponding FN plot. Finally, we remark that our results from numerical solution of Laplace's equation, for an array of conducting nano-emitters with uniform apex radii 50 nm but different local height, supports our theoretical assumptions and could used in orthodox CFE experiments to test our predictions.

show abstract

Enhanced field emission from lanthanum hexaboride coated multiwalled carbon nanotubes: Correlation with physical properties

Cited by 25 publications

References 39 publications

Electron Emission Devices for Energy‐Efficient Systems

Electron Emission Devices for Energy‐Efficient Systems

Improved field emission from indium decorated multi-walled carbon nanotubes

The consequences of dependence between the formal area efficiency and the macroscopic electric field on linearity behavior in Fowler–Nordheim plots

Contact Info

Product

Resources

About