Enhanced sensitivity and selectivity of a gas chromatography-microwave-induced plasma atomic emission system (GC-MIP) at the 685.6-nm fluorine emission line

Direct spectrometric determination of total fluorine in geological materials by continuous powder introduction into helium microwave induced plasma

“…[13][14][15] The detection limit below 4 ng ml À1 is achievable. 16 The determination of aqueous fluoride at the ppm level using ultrasonic nebulization and high-power He-MIP has been also described by Gehlhausen and Carnahan 17 and Okamoto et al 18 However, no application of helium plasma Warsaw University of Technology, Faculty of Chemistry, Department of Analytical Chemistry, ul. Noakowskiego 3, 00-664 Warsaw, Poland.…”

Indirect determination of fluoride in aqueous samples by inductively coupled plasma atomic emission spectrometry following precipitation of CeF3

“…Only a few papers are published about fluorine determination in gaseous samples at the non-resonant line (F I 685.602 nm) by ICP-AES using direct injection via a gas sampling loop or a gas chromatographic apparatus [1][2][3]. The fluorine emission line of 685.602 nm can be detected not only with ICP-AES but also with gas chromatography microwave induced plasma atomic emission spectrometry (MIP-AES) [4,5].…”

Determination of fluorine in aqueous samples by electrothermal vaporisation inductively coupled plasma mass spectrometry (ETV-ICP-MS)

“…3 The fluorine emission line of 685.602 mn can be detected not only with ICP-AES but also with gas chromatography microwave induced plasma AES. 4 In our previous paper, 5 the atomic emission assignable to the fluorine originating fluoride ion in aqueous solution was observed by electrothermal vaporisation (ETV) ICP-AES. Since the analyte had been separated from its solvent prior to introduction, effective excitation for atomic fluorine emission was achieved.…”