2011
DOI: 10.1103/physrevlett.106.140502
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Environment-Assisted Precision Measurement

Abstract: We describe a method to enhance the sensitivity of precision measurements that takes advantage of the environment of a quantum sensor to amplify the response of the sensor to weak external perturbations. An individual qubit is used to sense the dynamics of surrounding ancillary qubits, which are in turn affected by the external field to be measured. The resulting sensitivity enhancement is determined by the number of ancillas that are coupled strongly to the sensor qubit; it does not depend on the exact values… Show more

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Cited by 96 publications
(111 citation statements)
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“…U nderstanding and controlling the coherence of multispin-qubit solid-state systems is crucial for quantum information science [1][2][3] , basic research on quantum many-body dynamics 4 and quantum sensing and metrology [5][6][7][8][9] . Examples of such systems include nitrogen-vacancy (NV) colour centres in diamond 10 , phosphorous donors in silicon 11 and quantum dots 12 .…”
mentioning
confidence: 99%
“…U nderstanding and controlling the coherence of multispin-qubit solid-state systems is crucial for quantum information science [1][2][3] , basic research on quantum many-body dynamics 4 and quantum sensing and metrology [5][6][7][8][9] . Examples of such systems include nitrogen-vacancy (NV) colour centres in diamond 10 , phosphorous donors in silicon 11 and quantum dots 12 .…”
mentioning
confidence: 99%
“…Here we present only the result for many ancillas in the limit of small field b, following the derivation of Ref. [2]. We neglect for the moment the coupling of the sensor spin to the magnetic field and only keep first-order terms in the field.…”
Section: The Environment-assisted Metrology Schemementioning
confidence: 99%
“…Here we provide more details of the method presented in Ref. [2] and consider several extensions of the work. To this end we assume that the spin environment can be collectively controlled and partially polarized.…”
Section: The Environment-assisted Metrology Schemementioning
confidence: 99%
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