Abstract:Dependability of computer architectures has become one of the most important engineering concerns. One of the possibilities to increase the dependability is to develop architectures with dedicated self-test capabilities which allow achieving high quality of testing in terms of fault coverage. We propose a new methodology for Built-in Self-Test (BIST), which combines the inherent functionality of the architecture with a small amount of pre-generated test data stored in the memory, and uses for monitoring of the… Show more
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