Journal of Applied Physics
 2019
DOI: 10.1063/1.5110975
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Erratum: “Vacancy defects and optoelectrical properties for fluorine tin oxide thin films with various SnF2 contents” [J. Appl. Phys. 123, 025706 (2018)]

Yawei Zhou
1
,
Wenwu Xu
2
,
Jingjing Li
3
et al.
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