Estimation of crystal sample structure by means of fast electron radiation

Abstract

The dependence of the characteristics of X-ray radiation occurring under fast electron transmis sion through a crystal on a sample structure has been analyzed. A method to estimate the size of the crystal microblocks by means of the yield ratio of the parametric X-ray radiation and diffracted bremsstrahlung and transition radiation for different observation angles has been suggested. The possibility of estimating the dimension of the microblocks using the ratio of the intensities of these emission mechanisms for the same observation angle and several reflection orders has been discussed.