2015
DOI: 10.1016/j.actamat.2015.07.029
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Estimation of the activation energy for surface diffusion during metastable phase formation

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Cited by 50 publications
(44 citation statements)
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References 59 publications
(75 reference statements)
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“…Experimental phase formation data in the Cu–W thin films were obtained,[19] as shown in Figure 2(a). The maximum solid solubility limit of Cu in bcc-W is found to be approx.…”
Section: Resultsmentioning
confidence: 99%
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“…Experimental phase formation data in the Cu–W thin films were obtained,[19] as shown in Figure 2(a). The maximum solid solubility limit of Cu in bcc-W is found to be approx.…”
Section: Resultsmentioning
confidence: 99%
“…More information about deposition setup can be found elsewhere. [19] Composition of the samples was analyzed with a scanning electron microscope (SEM; JEOL JSM 6480, JEOL Ltd., Tokyo, Japan) equipped with an EDAX2000 energy dispersive X-ray spectrometer (EDX, EDAX Inc., Mahwah, NJ, USA). The thin film thickness was measured by cross-sectional SEM and the deposition rate was calculated by dividing film thickness by deposition time.…”
Section: Experimental and Theoretical Methodsmentioning
confidence: 99%
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“…332-341). In an attempt to quantify these barriers experimentally during vapor deposition at far-from-equilibrium conditions, they have instead been averaged into a single effective adatom surface diffusion barrier [103].…”
Section: Miscible and Immiscible Systemsmentioning
confidence: 99%