2022 IEEE 23rd Latin American Test Symposium (LATS) 2022
DOI: 10.1109/lats57337.2022.9936922
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Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool

Lucas B. Zilch
1
,
Allan G. Ferreira
2
,
Marcelo Lubaszewski
3
et al.
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