2018
DOI: 10.1107/s1600576718001449
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Evidence of damage evolution during creep of Al–Mg alloy using synchrotron X-ray refraction

Abstract: In order to provide further evidence of damage mechanisms predicted by the recent solid-state transformation creep (SSTC) model, direct observation of damage accumulation during creep of Al-3.85Mg was made using synchrotron X-ray refraction. X-ray refraction techniques detect the internal specific surface (i.e. surface per unit volume) on a length scale comparable to the specimen size, but with microscopic sensitivity. A significant rise in the internal specific surface with increasing creep time was observed,… Show more

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Cited by 16 publications
(12 citation statements)
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“…By using the image calculating software “Fiji Image J” the attenuation (μ·d) and the refraction value )(Cm·d are evaluated for each pixel according to Equations () and (), respectively. A detailed description of data conditioning and evaluation can be found in literature μ·d=-lnII0Cnormalm·d=1-IRInormalR0·I0I…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…By using the image calculating software “Fiji Image J” the attenuation (μ·d) and the refraction value )(Cm·d are evaluated for each pixel according to Equations () and (), respectively. A detailed description of data conditioning and evaluation can be found in literature μ·d=-lnII0Cnormalm·d=1-IRInormalR0·I0I…”
Section: Methodsmentioning
confidence: 99%
“…A detailed description of data conditioning and evaluation can be found in literature. 25,26 The influence of the specimen thickness d is eliminated by dividing the local refraction value C m ⋅ d by the local attenuation property ( ⋅ d). This yields the relative specific refraction value C m ∕ , which is correlated to the relative specific internal surface of the specimen.…”
Section: X-ray Refractionmentioning
confidence: 99%
“…By using the image calculating software “Fiji Image J” [24] the attenuation ( µ · d ) and the refraction value ( C m · d ) were evaluated for each pixel according to Equations (1) and (2), respectively. A detailed description of the data processing and evaluation can be found in [25,26]. μ·d=ln(I0I) Cm·d=1IR·I0IR0·I…”
Section: Methodsmentioning
confidence: 99%
“…Further details on the experimental procedure of SXRR can be found in Laquai et al, 26 Nellesen et al, 29 and Cabeza. 30 Because the analyzer crystal only distinguishes refracted X-rays within its scattering plane, the SXRR results depend on the orientation of the inner surfaces (defects, pores, etc.) with respect to the scattering vector of the analyzer crystal.…”
Section: Synchrotron X-ray Refraction Radiographymentioning
confidence: 99%