Evolution of level population in Ar interacting with XFEL pulses: impact of resonant absorptions

Abstract

Theoretical exploration of the population dynamics at fine-structure levels of Ar atoms interacting with ultrafast ultraintense x-ray free electron laser (XFEL) pulses is conducted. A time-dependent rate equation based on a detailed-level accounting approach is applied for tracking population levels, encompassing microscopic atomic processes such as photoexcitation, radiative decay, photoionization and Auger decay. A Monte Carlo algorithm is implemented to solve large-scale rate equations efficiently. The primary investigation centers on generating Ar17+ through resonant absorption by the second-harmonic radiation of the x-ray pulse. The calculated population ratios of Ar17+ to Ar16+ align well with the experimental measurements (LaForge et al 2021 Phys. Rev. Lett. 127 213202). In comparison to the transition energy of the strongest line, ( 1 s 2 ) 0 → ( 1 s 1 / 2 2 p 3 / 2 ) 1 of Ar16+, there is a distinct ∼25 eV red shift in the peak ratio, which is attributed to the presence of intricate resonant channels in the lower ionization stages. The results demonstrate the sensitivity of the population ratio Ar17+/Ar16+ to the laser pulse parameters such as x-ray pulse duration, bandwidth and the contribution of second-harmonic radiation, indicating their potential as diagnostic tools in future experiments.