2024
DOI: 10.3390/electronics13101976
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Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

Daniel van Niekerk,
Johan Venter

Abstract: This study investigated the reliability of Zener diodes subjected to a gradually increasing DC switching surge amplitude with delay internals between surges to avoid thermal degradation from different manufacturers with similar specifications. The analysis involved applying occasional 3 ms direct current (DC) switching surges with a gradual increasing surge voltage, followed by a constant current test to verify device functionality for three different selected manufacturer 5.1 V Zener diodes. This experimental… Show more

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