Experimental Study on Void Growth and EM Performance Under Directional Current Reversal

Zhang, Dingrui; Fan, Weihai; Li, Jizhou; Yang, Kelly

doi:10.1109/cstic52283.2021.9461514

2021 China Semiconductor Technology International Conference (CSTIC) 2021

DOI: 10.1109/cstic52283.2021.9461514

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Experimental Study on Void Growth and EM Performance Under Directional Current Reversal

Dingrui Zhang

Weihai Fan

Jizhou Li

et al.

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Experimental Study on Void Growth and EM Performance Under Directional Current Reversal

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