Experimental testing of a prototype cantilevered liquid-nitrogen-cooled silicon mirror

Cutler, Grant D.; Cocco, Daniele; Bentley, B.; Cervantes, M.; Chavez, P.; Chrzan, J.; DiMaggio, S.; Hussey, R.; Ilmberger, J.; Lindsay, J.; Lizotte, E.; McCombs, K.; Morton, Simon A.; Paulovits, G.; Pearson, K.; Redding, C.; Smith, N.; Tokunaga, K.; Zehm, D.; DiMasi, Elaine; Padmore, Howard

doi:10.1107/s1600577522010700

Cited by 2 publications

(1 citation statement)

References 17 publications

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“…This system was originally assembled to test the mirror developed for the ALS-U project. [1][2][3] In this system there is a transmission flat, the metrology beam is at normal incidence to the test mirror and there is no return flat (Fig. 2).…”

Section: Description Of Metrology System and Proceduresmentioning

confidence: 99%

Modeling and characterizing transmission windows for in-situ interferometric measurements of cryogenically cooled mirrors

Cutler,

Austin,

Huang

et al. 2023

Advances in Metrology for X-Ray and EUV Optics X

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In this paper we report on the modeling and characterization of transmission windows for in-situ interferometric measurements of cryogenically cooled mirrors. Specifically, we present a model of the temperature distribution and strain in the transmission window, and the corresponding spatial dependence of the window’s index of refraction. We also present experimental results which characterize the effect of the windows on interferometric measurement.

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Section: Description Of Metrology System and Proceduresmentioning

confidence: 99%

Modeling and characterizing transmission windows for in-situ interferometric measurements of cryogenically cooled mirrors

Cutler,

Austin,

Huang

et al. 2023

Advances in Metrology for X-Ray and EUV Optics X

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Estimation of Multiple Contact Conductances in a Silicon-Indium-Silicon Stack

Woodbury,

Cutler,

Najafi

et al. 2024

ASME Journal of Heat and Mass Transfer

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This report documents evaluation of simultaneous estimation of multiple interfacial heat transfer coefficients (HTCs) using transient measurements from an experiment designed for steady-state operation. The design of a mirror system for directing x-rays under cryogenic conditions requires knowledge of the interfacial HTC (contact conductance) between silicon and indium. An experimental apparatus was constructed to measure temperatures in a stack of five 7.62 mm thick pucks of silicon separated by 0.1 mm thick sheets of indium which is operated under cryogenic temperatures in vacuum. Multiple pucks and interfaces are incorporated into the apparatus to allow evaluation of HTCs for surfaces of different roughness from a single experiment. Analysis of the sensitivity of each of the measured temperatures to each of the unknown HTCs reveals lack of linear independence of these sensitivities and suggests the recovery of the HTCs will be challenging. Artificially noised “data” were created from two different computational models by solving for temperatures and adding random Gaussian noise with a specified standard deviation. These data are subsequently analyzed using two different iterative parameter estimation methods: a Levenberg scheme and a Tikhonov iterative scheme. The required sensitivity matrix is computed using forward finite difference approximations. The results for the heat transfer coefficients for this model problem suggest that coefficients cannot be estimated independently, but the ratios relative to one of the unknowns can be recovered.

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Experimental testing of a prototype cantilevered liquid-nitrogen-cooled silicon mirror

Cited by 2 publications

References 17 publications

Modeling and characterizing transmission windows for in-situ interferometric measurements of cryogenically cooled mirrors

Modeling and characterizing transmission windows for in-situ interferometric measurements of cryogenically cooled mirrors

Estimation of Multiple Contact Conductances in a Silicon-Indium-Silicon Stack

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